A JEOL JEM-2100F is field emission gun transmission electron microscope equipped with an imaging spherical aberration corrector (CEOS), Oxford INCA Energy TEM 200 EDS system, high-angle annular dark field detector, Gatan annular dark field detector/bright field detector, as well as Gatan (Tridiem) image filter (GIF) system. With the aberration corrector, the ultrahigh resolution atom imaging of crystal lattice can be readily achieved.
Specifications
- Acceleration Voltage: 80kV, 200kV
- Information limit: 1.4 Å or better, 1.9Å (80kV)
- Energy resolution: 0.92eV@110µA
- STEM resolution: 1.6 Å
- 2.7 Å (80kV)
- A probe size: < 2.0 Å
Cameras
- Gatan Orius SC 1000 (2k × 4k)
- GIF UltraScan (2k ×2k)
- STEM dark field detector / HAADF mode
Specimen stages
- Single tilt holder
- Double tilt low background holder
- In-situ heating/cooling/straining holder
- Hysitron PI-95 TEM PicoIndenter
- Dens Solution LIGHTING in-situ heating/biasing holder
A CS-corrected HRTEM provides the genuine atomic structures of materials which can reveal the atom arrangements at the interface and defects. The advantage of aberration-corrected HRTEM is that its aberration coefficient can be set close to zero, allowing the HRTEM image near Scherzer defocus to capture the true position of atomic columns.
EELS is a powerful technique that provides compositional and chemical information from sub-nanometer areas in the sample. Due to the large interaction cross-sections and narrow angular distribution of the scattered electrons, EELS is a very sensitive and highly localized technique. The benefit of core-level EELS is its sensitivity to all elements in the periodic table (except atomic hydrogen). The deexcitation processes are competitive, resulting in near zero x-ray yield for low Z elements and near zero Auger yield for high Z elements. In addition, EELS can probe the local density of states, making it uniquely suited to measure changes in local bonding at near-atomic resolution.
Combining micro- and nano-mechanical tests with (S)TEM offers a powerful method to study material behavior at the microscale. micro- and nano-mechanical test measures mechanical properties like strength and plasticity in small volumes, while TEM provides high-resolution imaging to analyze microstructures at the atomic level. This approach allows for detailed insights into how features such as dislocations and grain boundaries affect material performance, making it especially useful for studying nanostructured materials where traditional methods may not apply.