SEM Tescan MAGNA

The scanning electron microscope MAGNA from Tescan is a powerful tool for imaging in ultrahigh resolution. With each immersion optics and crossover-free electron beam it allows excellent imaging, also at low electron energies. With its manifold detectors

• Everhart-Thornley secondary electron detector
• In column secondary electron detector
• 4 quadrant backscatter detector
• Low-energy backscatter detector
• Scanning transmission detector, subdivided into four ring segments

it allows investigation of all kind of materials, investigated at the institute. The beam deceleration option and a “low vacuum modus” (chamber pressure up to 500 Pa) widen the imaging possibilities of this microscope.

• Electron backscatter diffraction detector (Bruker)
• Electron dispersive X-ray detector (Bruker)

are also attached to the SEM, complementing qualitative microstructural investigation capabilities with quantitative access onto chemistry and microstructure.