Bruker’s Dimension Icon^® brings the highest levels of performance, functionality, and AFM accessibility to nanoscale researchers in science and industry. Building upon the world’s most utilized large-sample AFM platform, it is the culmination of decades of technological innovation, customer feedback, and industry-leading application flexibility. The system has been designed from top to bottom to deliver the revolutionary low drift and low noise that allows users to achieve artifact-free images in minutes instead of hours.” (from https://www.bruker.com/en/products-and-solutions/microscopes/materials-afm/dimension-icon-afm.html)

At ESI, in addition to contact mode and intermittent contact mode (tapping), our Icon is equipped with Scan Asyst, Magnetic Force measurements (MFM), contact resistance (CR) and nanomechanical cantilevers (indent with AFM) for mechanical properties, as well as heating/cooling stages (-10°C up to 250°C).