The JEOL JEM-2220FS “Nanomap” is a field emission gun (scanning) transmission electron microscope equipped with in-column energy filter, high speed CMOS camera, windowless EDS detector for chemical analysis and direct electron detector and scan generator for precession nanodiffraction mapping and 4D STEM.
Specifications
- Acceleration Voltage: 80kV, 200kV
- FEG with <0.8eV
- Omega-Filter resolution <0.15eV
- HR Objective: 0.23 nm point resolution and 0.10 nm line resolution at 200kV
- Piezo stage
- Oxford AZtecEnergy UltimMax TEM 80 mm² windowless EDS detector
- TVIPS USG scan generator
Cameras
- High speed CMOS detector - TVIPS XF416, 4096x4096 pixel, up to 400fps
- Hybrid pixel direct electron detector - QuantumDetectors MerlinEM 4R, 512x512 pixel, up to 2000fps
- STEM HAADF and BF detector
Specimen stages
- Single tilt holder
- Double tilt low background holder
- Gatan 654 straining holder
- Gatan 652 double-tilt heating holder
- Hysitron PI-95 TEM PicoIndenter
- DENSSolution Lightning D9+ MEMS based heating/biasing holder
A wide range of in situ holders along with a high-speed CMOS detector enables imaging dynamical processes in complex materials with nanometer resolution. A unique setup combining in column omega filter, direct electron detector and programmable scan generator allows to carry out energy-filtered 4D STEM and precession nanodiffraction mapping.
