In 1993, the Erich Schmid Institute acquired its first scanning electron microscope (SEM), the Stereoscan 440 from Leica Cambridge, Ltd. To stay current with technological advancements, the institute upgraded to the LEO1525 from Zeiss in 2001. This SEM offers superior resolution and depth of focus compared to optical microscopes. Equipped with a field emission gun and a unique Gemini lens system, the LEO1525 delivers outstanding resolution, crucial for high-precision material science research, with a point resolution as fine as 1.5 nm at 20 kV. The microscope is also outfitted with advanced features for microstructure analysis and in-situ deformation studies, including:
- Electron backscatter diffraction (EBSD)
- Energy dispersive X-ray spectroscopy (EDS)
- Transmission Kikuchi diffraction (TKD)
- Orientation Imaging system (OIM)
Filament type: Schottky emitter (W/ZrO)
Acceleration voltage: 0.3 – 30 kV
Typical system vacuum: ~3.10-5 mbar
Column vacuum: ~1.10-9 mbar
Detectors:
- SE-detector (Everhart-Thornley)
- Four quadrant back scatter detector
- InLens-detector
The LEO1525 is also equipped with the option to integrate a compact loading module from Kammrath & Weiss. This versatile module enables the performance of various tests, including tension, compression, and three- and four-point bending, with a maximum load capacity of 10kN.
