Many aspects of modern material development (e.g. energy materials, energy conversion and storage, green steel, etc.) require detailed understanding of the local accommodation and material modification processes during use. This implied that we need to understand where and how fundamental energy carriers such as hydrogen or lithium are incorporated in the material, and how this changes the material structure and its operational performance. As these species are highly mobile and to some extent volatile, it is indispensable to keep them in place by freezing them in before subjecting them to further detailed investigation.

In our CEMPER (Correlative Chemical, Electrical, and Mechanical Properties of operational Energy-Related materials) concept, we utilize a complete cryogenic work flow to cool the material to liquid nitrogen temperatures and transfer it into a focused ion beam workstation. This instrument uniquely combines the possibilities for local high resolution imaging (SE, in-lense imaging) and spectroscopy (EDS, TOF-SIMS) for correlated structural and chemical analysis. Furthermore, the focused ion beam in conjunction with micromanipulator and gas injection system enable to site-specifically modify and extract material samples of interest. These are subsequently transferred either to a dedicated cryo-TEM holder for investigation of the material at highest resolution in our advanced TEMs, or mechanically characterized using micro- and nanomechanical testing, respectively.

Other areas of interest for this unique infrastructure in Austria encompass:

• Brittle-ductile transition of structural materials
• Grain boundary engineering topologically or compositionally complex materials
• Beam sensitive materials such as aluminium alloys or polymers
• And many others

The CEMPER workflow involves:

• ThermoFischer Helios 5 PFIB CXe
  • Ultra-high brightness field emission electron column Elstar with UC+ technology
    • Landing energies: adjustable from 20 V to 30 kV
    • Beam current: 0.8 pA – 100 nA (0.8 pA – 100 pA in UC mode)
    • Resolution: 0.6 nm @ 2 – 15 keV landing energy
  • Xe plasma focused ion beam column
    • Landing Energies: Adjustable from 500 V to 30 kV
    • Beam current: 1 pA to 2.5 μA in 14 steps (@ 30 kV)
    • Resolution: <20 nm @ 30 kV using preferred statistical method
  • SE detector, in-lens detector, BSE detector, retractable STEM 3+ detector
  • EasyLift EX Nanomanipulator and MultiChem gas delivery system
  • Fully automated AutoTEM 5 in situ TEM sample preparation workflow
  • TOF SIMS CTOF from ToFWerk
    • Lateral resolution: < 50 nm
    • Depth resolution: < 20 nm for 5 kV Ga FIB
    • Maximum mass: 500-600 Th
    • Mass resolution: 800 - M/ΔM at M around 120
  • Plasma cleaner and charge compensator
  • Cryo stage, cryo manipulator and cryo transfer capabilities
• Cryo-TEM specimen holder compatible with JEOL 2100F & JEOL 2200FS
• Glove box for sample preparation, cooling and transfer

Delivery of the instrument is scheduled for December 2024.