Bruker’s Dimension Icon® brings the highest levels of performance, functionality, and AFM accessibility to nanoscale researchers in science and industry. Building upon the world’s most utilized large-sample AFM platform, it is the culmination of decades of technological innovation, customer feedback, and industry-leading application flexibility. The system has been designed from top to bottom to deliver the revolutionary low drift and low noise that allows users to achieve artifact-free images in minutes instead of hours.” (from

At ESI, in addition to contact mode and intermittent contact mode (tapping), our Icon is equipped with Scan Asyst, Magnetic Force measurements (MFM), contact resistance (CR) for mechanical properties, and heating/cooling stages (-10°C up to 250°C).