Bruker’s Dimension Icon® brings the highest levels of performance, functionality, and AFM accessibility to nanoscale researchers in science and industry. Building upon the world’s most utilized large-sample AFM platform, it is the culmination of decades of technological innovation, customer feedback, and industry-leading application flexibility. The system has been designed from top to bottom to deliver the revolutionary low drift and low noise that allows users to achieve artifact-free images in minutes instead of hours.” (from https://www.bruker.com/en/products-and-solutions/microscopes/materials-afm/dimension-icon-afm.html)
At ESI, in addition to contact mode and intermittent contact mode (tapping), our Icon is equipped with Scan Asyst, Magnetic Force measurements (MFM), contact resistance (CR) for mechanical properties, and heating/cooling stages (-10°C up to 250°C).
