329 results:
1. ESI  
Secretary University Leoben: Phone: +43 3842 804 112 e-mail: sabine.wilfling@unileoben.ac.at Secretary Austrian Academy of Sciences: Phone: +43 3842 804 111 e-mail:…  
2. Megan Cordill - one of the new winners of the Houzka Prize  
Megan Cordill, researcher at the Erich Schmid Institute for Materials Science of the Austrian Academy of Sciences (ÖAW) is one of the new winners of the Houska Prize. She and her co-applicant,…  
3. Featured Article in the journal of NPG Asia Materials  
Our manuscript entitled "Signature of local stress states in the deformation behavior of metallic glasses" published in the journal of NPG Asia Materials was selected as the "Featured Article"  
4. Leobener Forscher - Zwei Projekte für gewichtigen Forscherpreis nominiert  
Bericht der Kleinen Zeitung vom 16. September 2020  
5. Zeiss Auriga Laser  
The Zeiss Auriga LaserFIB system combines the advantages of the CrossBeam technology, consisting of a focused ion beam column (Orsay Physics Ga+ ion FIB) and a scanning electron column…  
6. Wafer Curvature  
Understanding and controlling stresses in thin-films and during thermal annealing process is critical for achieving the desired optical, electronic and mechanical properties. Many of today´s high…  
7. SEM-LEO982  
The LEO-982 is a scanning electron microscope (SEM) with a field emission gun (FEG) that is dedicated for in-situ micro mechanical testing at high resolution. For imaging an Everhart Thornley…  
8. Bruker-Axs Nanostar  
Small-angle X-ray scattering system designed for SAXS, WAXS and GISAXS investigations. The system is equipped with Vantec-2000 detector and image plate, Incoatec microfocus source IµS, XY stage…  
9. AFM - Veeco Dimension 3100 - Hysitron Triboscope  
The Veeco Dimension AFM is a large sample platform for almost all standard SPM techniques (topography imaging including phase mapping, MFM, LFM, force plots etc.). Replacing the standard…  
10. FIB LEO1540  
The LEO 1540XB is a dual beam focused ion beam (FIB) workstation equipped with a field emission gun (FEG). For imaging an Everhart Thornley Detector (SE-Detector) or an Inlens-Detector are…  
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