Megan Cordill, researcher at the Erich Schmid Institute for Materials Science of the Austrian Academy of Sciences (ÖAW) is one of the new winners of the Houska Prize. She and her co-applicant,…
Our manuscript entitled "Signature of local stress states in the deformation behavior of metallic glasses" published in the journal of NPG Asia Materials was selected as the "Featured Article"
The Zeiss Auriga LaserFIB system combines the advantages of the CrossBeam technology, consisting of a focused ion beam column (Orsay Physics Ga+ ion FIB) and a scanning electron column…
Understanding and controlling stresses in thin-films and during thermal annealing process is critical for achieving the desired optical, electronic and mechanical properties. Many of today´s high…
The LEO-982 is a scanning electron microscope (SEM) with a field emission gun (FEG) that is dedicated for in-situ micro mechanical testing at high resolution. For imaging an Everhart Thornley…
Small-angle X-ray scattering system designed for SAXS, WAXS and GISAXS investigations. The system is equipped with Vantec-2000 detector and image plate, Incoatec microfocus source IµS, XY stage…
The Veeco Dimension AFM is a large sample platform for almost all standard SPM techniques (topography imaging including phase mapping, MFM, LFM, force plots etc.).
Replacing the standard…
The LEO 1540XB is a dual beam focused ion beam (FIB) workstation equipped with a field emission gun (FEG). For imaging an Everhart Thornley Detector (SE-Detector) or an Inlens-Detector are…