Univ.-Prof. Dr. Jozef Keckes
Function: Vice Chair Material Physics / Group Leader
Room: 303
Phone: +43 (0) 3842-804-303
E-Mail: jozef.keckes(at)unileoben.ac.at
Research
Micro- and Nanostructure Characterization and Micro- and Nanomechanics
Methods
In-situ X-ray scattering on micro- and nano-scaled materials, structure and mechanical properties of thin films, structure-property relationship in biological materials, application of synchrotron radiation, XRD, SAXS, WAXS, GISAXS
Teaching
Materialkundliche Arbeitsverfahren/Metallkundliche Arbeitsverfahren, Seminar aus Werkstoffphysik I and II, Übungen zu Materialkundliche Arbeitsverfahren
Projects
Publications
- Surface structuring by Electron Beam for improved soft tissues adhesion and reduced bacterial contamination on Ti-grade 2J. Mater. Process. Technol.266, 518-529 (2019)
- Gradients of microstructure, stresses and mechanical properties in a multi-layered diamond thin film revealed by correlative cross-sectional nano-analyticsCarbon144, 666-674 (2019)
- Biomimetic hard and tough nanoceramic Ti-Al-N film with self-assembled six-level hierarchyNanoscale2019,11, 7986-7995 (2019)
- Lignin-based multiwall carbon nanotubesComposites Part A121, 175-179 (2019)
- Structure-stress relationships in nanocrystalline multilayered Al0.7Cr0.3N/Al0.9Cr0.1N coatings studied by cross-sectional X-ray nanodiffractionMaterials and Design170 (2019), 107702 (2019)
- Study of Cu0 Nanowire Growth on Different Copper SurfacesScientific Reports9, ARTN 37172-8 (2019)
- Anisotropy of fracture toughness in nanostructured ceramics controlled by grain boundary designMaterials and Design, 80-85 (2019)
- Deformation characteristics of ultrafine grained and nanocrystalline iron and pearlitic steel - An in situ synchrotron investigationActa Mater.160, 22-33 (2018)
- Strain energy contributions on the bainitic phase transformation in a CrMoV steel during continuous coolingMater. Des.155, 475-484 (2018)
- Design and development of MEMS-based structures for in-situ characterization of thermo-mechanical behaviour of thin metal filmsMicroelectron. Reliab.88-90, 829-834 (2018)