Univ.-Prof. Dr. Jozef Keckes
Function: Vice Chair Material Physics / Group Leader
Room: 303
Phone: +43 (0) 3842-804-303
E-Mail: jozef.keckes(at)unileoben.ac.at
Research
Micro- and Nanostructure Characterization and Micro- and Nanomechanics
Methods
In-situ X-ray scattering on micro- and nano-scaled materials, structure and mechanical properties of thin films, structure-property relationship in biological materials, application of synchrotron radiation, XRD, SAXS, WAXS, GISAXS
Teaching
Materialkundliche Arbeitsverfahren/Metallkundliche Arbeitsverfahren, Seminar aus Werkstoffphysik I and II, Übungen zu Materialkundliche Arbeitsverfahren
Projects
Publications
- Surface oxidation of nanocrystalline CVD TiB2 hard coatings revealed by cross-sectional nano-analytics and in-situ micro-cantilever testingSurf. Coat. Technol.399, ARTN 126181 (2020)
- Multi-scale interface design of strong and damage resistant hierarchical nanostructured materialsMater. Des.196, ARTN 109169 (2020)
- Extraordinary high-temperature behavior of electrically conductive Hf7B23Si22C6N40 ceramic filmSurf. Coat. Technol.391, ARTN 125686 (2020)
- Indentation response of a superlattice thin film revealed by in-situ scanning X-ray nanodiffractionActa Materialia195, 425-432 (2020)
- Nanoscale evolution of stress concentrations and crack morphology in multilayered CrN coating during indentation: Experiment and simulationMater. Des.188, ARTN 108478 (2020)
- Nanoscale residual stress and microstructure gradients across the cutting edge area of a TiN coating on WC-CoScripta Materialia182, 11-15 (2020)
- Non-destructive Testing of Thin Birch (Betula pendula Roth.) VeneersBioResources15, 1265-1281 (2020)
- Inconel-steel multilayers by liquid dispersed metal powder bed fusion: Microstructure, Residual stress and Property GradientsAdditive Manufacturing32, ARTN 101027 (2019)
- Stress-controlled decomposition routes in cubic AlCrN films assessed by in-situ high-temperature high-energy grazing incidence transmission X-ray diffractionScientific ReportsNature9, ARTN 18027 (2019)
- Microstructure and stress gradients in TiW thin films characterized by 40 nm X-ray diffraction and transmission electron microscopyThin Solid Films691, ARTN 137576 (2019)