Univ.-Prof. Dr. Jozef Keckes

Function: Vice Chair Material Physics / Group Leader
Room: 303
Phone: +43 (0) 3842-804-303
E-Mail: jozef.keckes(at)unileoben.ac.at

Research

Micro- and Nanostructure Characterization and Micro- and Nanomechanics

Methods

In-situ X-ray scattering on micro- and nano-scaled materials, structure and mechanical properties of thin films, structure-property relationship in biological materials, application of synchrotron radiation, XRD, SAXS, WAXS, GISAXS

Teaching

Materialkundliche Arbeitsverfahren/Metallkundliche Arbeitsverfahren, Seminar aus Werkstoffphysik I and II, Übungen zu Materialkundliche Arbeitsverfahren

Projects

 

Publications

  • Extraordinary high-temperature behavior of electrically conductive Hf7B23Si22C6N40 ceramic film
    P. Zeman, S. Zuzjakova, R. Cerstvy, J. Houska, Y. Shen, J. Todt, J. Jiang, R. Daniel, J. Keckes, E. Meletis, J. Vlcek
    Surf. Coat. Technol.391, ARTN 125686 (2020)
  • Indentation response of a superlattice thin film revealed by in-situ scanning X-ray nanodiffraction
    J. Todt, C. Krywka, Z. Zhang, P. Mayrhofer, J. Keckes, M. Bartosik
    Acta Materialia195, 425-432 (2020)
  • Nanoscale residual stress and microstructure gradients across the cutting edge area of a TiN coating on WC-Co
    M. Meindlhumer, N. Jäger, S. Spor, M. Rosenthal, J.F. Keckes, H. Hruby, C. Mitterer, R. Daniel, J. Keckes, J. Todt
    Scripta Materialia182, 11-15 (2020)
  • Non-destructive Testing of Thin Birch (Betula pendula Roth.) Veneers
    M. Pramreiter, A. Stadlmann, F. Linkeseder, J. Keckes, U. Mueller
    BioResources15, 1265-1281 (2020)
  • Inconel-steel multilayers by liquid dispersed metal powder bed fusion: Microstructure, Residual stress and Property Gradients
    S.C. Bodner, L. van der Vorst, J. Zalesak, J. Todt, J.F. Keckes, V. Maier-Kiener, B. Sartory, N. Schell, J. Hooijmans, J. Saurwalt, J. Keckes
    32, ARTN 101027 (2019)
  • Stress-controlled decomposition routes in cubic AlCrN films assessed by in-situ high-temperature high-energy grazing incidence transmission X-ray diffraction
    M. Meindlhumer, S. Klima, N. Jäger, A. Stark, H. Hruby, C. Mitterer, J. Keckes, R. Daniel
    Scientific ReportsNature9, ARTN 18027 (2019)
  • Microstructure and stress gradients in TiW thin films characterized by 40 nm X-ray diffraction and transmission electron microscopy
    F. Saghaeian, J. Keckes, S. Woehlert, M. Rosenthal, M. Reisinger, J. Todt
    Thin Solid Films691, ARTN 137576 (2019)
  • Investigation of high cyclic fatigue behaviour of thin copper films using MEMS structure
    F. Saghaeian, M. Lederer, A. Hofer, J. Todt, J. Keckes, G. Khatibi
    Int. J. Fatigue128, ARTN 105179 (2019)
  • Combined thermo-physical investigations of thin layers with Time Domain Thermoreflectance and Scanning Thermal Microscopy on the example of 500 nm thin, CVD grown tungsten
    K. Fladischer, V. Leitgeb, L. Mitterhuber, G. Maier, J. Keckes, M. Sagmeister, S. Carniello, S. Defregger
    Thermochim. Acta681, ARTN 178373 (2019)
  • Point-defect engineering of MoN/TaN superlattice films: A first-principles and experimental study
    N. Koutna, R. Hahn, J. Zalesak, M. Friak, M. Bartosik, J. Keckes, M. Sob, P. Mayrhofer, D. Holec
    Mater. Des.186, ARTN 108211 (2019)