19.04.2013

Materials analysis by use of modern X-ray diffraction techniques

Pietsch Ullrich

3rd generation Synchrotron sources allow for spatial and time resolved measurements of materials. In this talk we present preliminary results of high-energy X-ray diffraction experiments at PETRA III using a nanobeam which size similar to the average of austenite and ferrite grains. WE found increasing percentage of split Bragg peaks as function of fatique cycle number and the position along the sample. The split behaviour correlates well with the local stress along the sample predicted by FEM calculation. Next we show examples of a new 3D energy- and position sensitive detector which allows for new experimental approach to solve the strain-stress problem in materials. At example of TiN coated Silicon wafers we show that one can measure both strain induced sample bending and strain simulataneous. First data evaluation verifies the prediction.

 

Institution: 
Solid state Physics, Siegen University

Date: 
Friday, April 19, 2013 - 11:45

Speaker: 
Pietsch Ullrich