Univ.-Prof. Dr. Jozef Keckes

Function: Vice Chair Material Physics / Group Leader
Room: 303
Phone: +43 (0) 3842-804-303
E-Mail: jozef.keckes(at)unileoben.ac.at

Research

Micro- and Nanostructure Characterization and Micro- and Nanomechanics

Methods

In-situ X-ray scattering on micro- and nano-scaled materials, structure and mechanical properties of thin films, structure-property relationship in biological materials, application of synchrotron radiation, XRD, SAXS, WAXS, GISAXS

Teaching

Materialkundliche Arbeitsverfahren/Metallkundliche Arbeitsverfahren, Seminar aus Werkstoffphysik I and II, Übungen zu Materialkundliche Arbeitsverfahren

Projects

 

Publications

  • Macroscopic Fracture Behaviour of CrN Hard Coatings Evaluated by X-Ray Diffraction Coupled with Four-Point BendingM. Stefenelli, A. Riedl, J. Todt, M. Bartosik, R. Daniel, C. Mitterer, J. KeckesMaterials Science Forum, 272-279 (2014)
    RIS ENW BIB
  • Depth-resolved residual stress analysis with high-energy synchrotron X-rays using a conical slit cellP. Staron, T. Fischer, J. Keckes, S. Schratter, T. Hatzenbichler, N. Schell, M. Müller, A. SchreyerMaterials Science Forum, 72-75 (2014)
    RIS ENW BIB
  • Supersaturation in Ag–Ni alloy by two-step high-pressure torsion processingA. Bachmaier, J. Keckes, K. Kormout, R. PippanPhilosophical Magazine Letters, 9-17 (2014)
    RIS ENW BIB
  • Radial crystalline texture in a lyocell fibre revealed by synchrotron nanofocus wide-angle X-ray scatteringW. Gindl-Altmutter, S.J. Eichhorn, M. Burghammer, J. KeckesCellulose, 1-7 (2013)
    RIS ENW BIB
  • Origins of microstructure and stress gradients in nanocrystalline thin films: The role of growth parameters and self-organizationR. Daniel, J. Keckes, I. Matko, M. Burghammer, C. MittererActa Materialia, 6255-6266 (2013)
    RIS ENW BIB
  • Cross-sectional X-ray nanobeam diffraction analysis of a compositionally graded CrNx thin filmM. Bartosik, R. Daniel, C. Mitterer, I. Matko, M. Burghammer, P.H. Mayrhofer, J. KeckesThin Solid Films, 1-4 (2013)
    RIS ENW BIB
  • Self-organized periodic soft-hard nanolamellae in polycrystalline TiAlN thin filmsJ. Keckes, R. Daniel, C. Mitterer, I. Matko, B. Sartory, A. Koepf, R. Weißenbacher, R. PitonakThin Solid Films545, 29-32 (2013)
    RIS ENW BIB
  • X-ray analysis of residual stress gradients in TiN coatings by a Laplace space approach and crosssectional nanodiffraction: a critical comparisonM. Stefenelli, J. Todt, A. Riedl, W. Ecker, T. Müller, R. Daniel, M. Burghammer, J. KeckesJournal of Applied Crystallography46, 1-8 (2013)
    RIS ENW BIB
  • Effects of structure and interfaces on fracture toughness of CrN/AlN multilayer coatingsSchlögl Manfred K.C.Scripta Materialia, 917-920 (2013)
    RIS ENW BIB
  • Influence of AlN layers on mechanical properties and thermal stability of Cr-based nitride coatingsSchlögl Manfred P.J.Thin Solid Films, 113-118 (2013)
    RIS ENW BIB