Surface characterization of ordered and disordered SiO2 [SiO tief 2]

Surface characterization of ordered and disordered SiO2 [SiO tief 2] / Wolfram Steurer

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Bibliographic Details
VerfasserIn:
Steurer, Wolfram
Place / Publishing House:2008
Year of Publication:2008
Language:English
Subjects:
Quarz alpha- (DE-588)4142011-1 Oberflächeneigenschaft (DE-588)4219221-3 Heliumstreuung (DE-588)4384567-8
Glas (DE-588)4021142-3 Oberflächeneigenschaft (DE-588)4219221-3 Heliumstreuung (DE-588)4384567-8
Classification:33.05 - Experimentalphysik
33.68 - Oberflächen. Dünne Schichten. Grenzflächen
Physical Description:XI, 147 S.; graph. Darst.
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spelling Steurer, Wolfram aut
Surface characterization of ordered and disordered SiO2 <<[SiO tief 2]>> Wolfram Steurer
2008
XI, 147 S. graph. Darst.
Graz, Techn. Univ., Diss., 2008
Quarz alpha- s (DE-588)4142011-1
Oberflächeneigenschaft s (DE-588)4219221-3
Heliumstreuung s (DE-588)4384567-8
AT-OBV ONBREB
Glas s (DE-588)4021142-3
YWOAW MAG1-3 37381-C.Stip. 2216957390004498
language English
format Thesis
Book
author Steurer, Wolfram
spellingShingle Steurer, Wolfram
Surface characterization of ordered and disordered SiO2 [SiO tief 2]
Quarz (DE-588)4142011-1
Oberflächeneigenschaft (DE-588)4219221-3
Heliumstreuung (DE-588)4384567-8
Glas (DE-588)4021142-3
author_facet Steurer, Wolfram
author_variant w s ws
author_role VerfasserIn
author_sort Steurer, Wolfram
title Surface characterization of ordered and disordered SiO2 [SiO tief 2]
title_full Surface characterization of ordered and disordered SiO2 [SiO tief 2] Wolfram Steurer
title_fullStr Surface characterization of ordered and disordered SiO2 [SiO tief 2] Wolfram Steurer
title_full_unstemmed Surface characterization of ordered and disordered SiO2 [SiO tief 2] Wolfram Steurer
title_auth Surface characterization of ordered and disordered SiO2 [SiO tief 2]
title_new Surface characterization of ordered and disordered SiO2 [SiO tief 2]
title_sort surface characterization of ordered and disordered sio2
publishDate 2008
physical XI, 147 S. graph. Darst.
callnumber-raw 37381-C.Stip.
callnumber-search 37381-C.Stip.
topic Quarz (DE-588)4142011-1
Oberflächeneigenschaft (DE-588)4219221-3
Heliumstreuung (DE-588)4384567-8
Glas (DE-588)4021142-3
topic_facet Quarz
Oberflächeneigenschaft
Heliumstreuung
Glas
illustrated Not Illustrated
work_keys_str_mv AT steurerwolfram surfacecharacterizationoforderedanddisorderedsio2siotief2
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hol852hSignatur_txt_mv 37381-C.Stip.
hol852cSonderstandort_txt_mv MAG1-3
itmData_txt_mv 2009-04-16 02:00:00 Europe/Vienna
barcode_str_mv +YW14505700
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is_hierarchy_id AC07538385
is_hierarchy_title Surface characterization of ordered and disordered SiO2 <<[SiO tief 2]>>
basiskl_str_mv 33.05 - Experimentalphysik
33.68 - Oberflächen. Dünne Schichten. Grenzflächen
basiskl_txtF_mv 33.05 - Experimentalphysik
33.68 - Oberflächen. Dünne Schichten. Grenzflächen
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