Surface characterization of ordered and disordered SiO2 [SiO tief 2] / Wolfram Steurer
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| Place / Publishing House: | 2008 |
| Year of Publication: | 2008 |
| Language: | English |
| Subjects: | |
| Classification: | 33.05 - Experimentalphysik 33.68 - Oberflächen. Dünne Schichten. Grenzflächen |
| Physical Description: | XI, 147 S.; graph. Darst. |
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| ac_no: | AC07538385 |
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| Hierarchical level: | Monograph |
| Statement of Responsibility: | Wolfram Steurer |