GaN HEMT modeling including trapping effects based on Chalmers model and pulsed S-parameter measurements / / vorgelegt von Peng Luo.

Saved in:
Bibliographic Details
VerfasserIn:
Place / Publishing House:Gottingen : : Cuvillier Verlag,, 2018.
Year of Publication:2018
Language:English
Online Access:
Physical Description:1 online resource (160 pages)
Tags: Add Tag
No Tags, Be the first to tag this record!
Description
ISBN:9783736999060
9783736989061 (ebook)
Hierarchical level:Monograph
Statement of Responsibility: vorgelegt von Peng Luo.