Physica status solidi / A. / Volume 99, Number 2, : February 16 ; PSSA-B, / / ed. by Görlich.
Gorde:
Other title: | Frontmatter -- International Classification System for Physics -- Contents -- Original Papers and Short Notes -- Structure; crystallography -- On the Interference Effect Arising in the Bicrystal X-Ray Interferometer with Wedge-Shaped Gap. II. Spherical Wave Theory -- Ultra-Thin Foil Thickness Determination from Large-Angle Convergent Beam Electron Diffraction Patterns -- X-Ray Spherical-Wave Diffraction in the Bragg Case for Bent Si Crystals -- Defects; nonelectronic transport -- Dislocation Internal Friction in Csl Single Crystals -- Work-Hardening and Recovery during the Steady-State Creep of Polycrystalline Cadmium -- Relaxation Phenomena of Dislocations Contributing to Deformation of A1 at Intermediate Temperatures -- Dislocation Velocities in Cu-Ni Alloys Determined by the Stress Pulse-Etch Pit Technique and by Slip Line Cinematography -- The Investigation of Point Defects in Lead Molybdate Crystals Which Lead to the Change of Absorption and Fluorescence Properties -- A TEM Investigation of the Dislocation Rosettes around Vickers Indentations in GaAs -- Lattice properties -- Low-Temperature Heat Capacity and Thermodynamic Properties of Silicon-Dioxide-Based Binary Vitreous Systems -- Average Elastic Constants and Tensor Invariants -- An Application of Potential Theory for Solving the Plane Elastic Crack Problem -- Conditions générales d'obtention de parois cohérentes sans contraintes entre domaines élastiques -- Experimental Observations of Transient Phases during Long-Range Ordering to Ni4Mo in a Ni- Mo- Fe- Cr Alloy -- Phase Transitions between the Quasicrystalline, Crystalline, and Amorphous Phases in Al-16 at% V -- Nonlinear Resonances in Mn-7 at% Cu -- Stiffness Constants, Dislocation Line Energies, and Tensions of M8A1 and of the y -Phases of NIMONIC 105 and of NIMONIC PE16 -- On Deriving Tickers Hardness from Penetration Depth -- Surfaces, interfaces, thin films; lower-dimensional systems -- Some Optical and Structural Studies on SiO/SnO2 Thin Films -- High-Field Electrical Conduction in Thin Films of Polyethylene -- Determination of the Low Absorption Coefficients of Thin Cd1-xZnxS Films by Photothermal Deflection Spectroscopy -- Effect of Sulphur on the Surface Segregation in Co50Ni50 Alloy -- Ionic Current Study in Thermally Grown Silicon Dioxide Films on Polycrystalline Silicon -- Investigation of the Surface States in Heavily Doped GaAs by Kelvin Probe -- Influence of Texture Formation on Properties of Films for Perpendicular Magnetic Recording -- Characterization of the Leakage-Current Diffusion Component in Intrinsically Gettered Silicon by EBIC -- Auger Electron and X-Ray Spectroscopic Analysis of Au-Ge Contacts to GaAs -- Localized electronic states -- Thermal Donors and Carbon-Oxygen Defects in Silicon -- Electronic transport; superconductivity -- Electrical Resistivity and Scattering Mechanisms of (GeTe)1-x ((Ag2Te)1-y (Sb2Te3)y)x Solid Solutions (y = 0.6) -- Electrical Characteristics of Melt Grown CuInTe2 Single Crystals -- Magnetic properties; resonances -- Magnetic Properties of Rapidly Quenched Fe75B25-xNdx (0 ≤ x ≤ 25) Alloys -- Photoinduced Change of Magnetic Resonance in FeBO3 Single Crystals -- Study of the Magnetic Transitions in CeFe2 with High Resolution Transport Property Measurements -- Dielectric and optical properties -- Dielectric Properties of the KCl-KBr Mixed Crystal System -- Dielectric and Ferroelectric Properties in AsxSb1-xSI Mixed Crystals -- Device-related phenomena -- Modelling the Influence of Hot Electrons on the Transfer Characteristic of Short-Channel MOSFETs -- Properties of Red Light-Emitting (AlGa)As Single-Heterostructure Diodes. I. Structure Characterization -- Short Notes -- On the Thermal Conductivity of CuInSe2xS2(1-x) -- Pressure Dependence of the Bulk Modulus in Solids -- Transformation Toughening Fatigue Crack Growth -- Surface Properties of Ion Alloyed Thin Dysprosium Films -- Dose Dependence of N(E-F) in Evaporated a-Si -- Attempts to Find a Correlation between the GaAs Plasma Oxide Growth Conditions and the Charge DLTS Response of Interface States -- On DLTS-Measurements of t h e Barrier-Limited Capture Process -- Thermally Stimulated Exoelectron Emission (TSEE) of Heat Treated K2SO4 and of Sm-Dy-Doped K2SO4 -- Aspects of Magnetic Penetration in Vanadium Based Josephson Junctions -- Polynomial Expression of the Bloch-Gruneisen Integral — Application to an Analysis of the Resistivity-Temperature Variation of Metals -- EPR Investigations on Mn-Doped CVD-Grown ZnS Thin Film Layers -- Preparation and Magnetic Properties-of La1-xThxCoO3 Compounds -- The Dependence of the Hyperfine Magnetic Field in Amorphous Alloys of the Type Fe80-xTMxB20 on TM, x, and Temperature -- The Influence of Yttrium Substitution on the Ferromagnetic Transition of Uranium Selenide -- Thermoluminescence and Thermally Stimulated Exoelectron Emission of Sintered CaB4O7 Doped with Fb, Eu, or Dy -- On the Possibility of Application of the Derivative Lightoutput-Voltage Characteristic for the Analysis of Electron-Phonon Interaction in Electroluminescent ZnSe MPS Structures -- Effects of Carbon Profiles at the p/i Interface in Amorphous Silicon Solar Cells -- A Simple Model of the Drain Saturation Voltage Dependence with Gate Voltage for Short-Channel MOSFETs -- Pre-Printed Titles -- Pre-Printed Titles of papers to be published in the next issues of physica status solidi (a) and physica status solidi (b) -- Substance Classification -- Backmatter |
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Formatua: | Mode of access: Internet via World Wide Web. |
ISBN: | 9783112501665 9783110637342 |
DOI: | 10.1515/9783112501665 |
Sartu: | restricted access |
Hierarchical level: | Monograph |
Statement of Responsibility: | ed. by Görlich. |
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