Physica status solidi / A. / Volume 99, Number 2, : February 16 ; PSSA-B, / / ed. by Görlich.
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Table of Contents:
- Frontmatter
- International Classification System for Physics
- Contents
- Original Papers and Short Notes
- Structure; crystallography
- On the Interference Effect Arising in the Bicrystal X-Ray Interferometer with Wedge-Shaped Gap. II. Spherical Wave Theory
- Ultra-Thin Foil Thickness Determination from Large-Angle Convergent Beam Electron Diffraction Patterns
- X-Ray Spherical-Wave Diffraction in the Bragg Case for Bent Si Crystals
- Defects; nonelectronic transport
- Dislocation Internal Friction in Csl Single Crystals
- Work-Hardening and Recovery during the Steady-State Creep of Polycrystalline Cadmium
- Relaxation Phenomena of Dislocations Contributing to Deformation of A1 at Intermediate Temperatures
- Dislocation Velocities in Cu-Ni Alloys Determined by the Stress Pulse-Etch Pit Technique and by Slip Line Cinematography
- The Investigation of Point Defects in Lead Molybdate Crystals Which Lead to the Change of Absorption and Fluorescence Properties
- A TEM Investigation of the Dislocation Rosettes around Vickers Indentations in GaAs
- Lattice properties
- Low-Temperature Heat Capacity and Thermodynamic Properties of Silicon-Dioxide-Based Binary Vitreous Systems
- Average Elastic Constants and Tensor Invariants
- An Application of Potential Theory for Solving the Plane Elastic Crack Problem
- Conditions générales d'obtention de parois cohérentes sans contraintes entre domaines élastiques
- Experimental Observations of Transient Phases during Long-Range Ordering to Ni4Mo in a Ni- Mo- Fe- Cr Alloy
- Phase Transitions between the Quasicrystalline, Crystalline, and Amorphous Phases in Al-16 at% V
- Nonlinear Resonances in Mn-7 at% Cu
- Stiffness Constants, Dislocation Line Energies, and Tensions of M8A1 and of the y -Phases of NIMONIC 105 and of NIMONIC PE16
- On Deriving Tickers Hardness from Penetration Depth
- Surfaces, interfaces, thin films; lower-dimensional systems
- Some Optical and Structural Studies on SiO/SnO2 Thin Films
- High-Field Electrical Conduction in Thin Films of Polyethylene
- Determination of the Low Absorption Coefficients of Thin Cd1-xZnxS Films by Photothermal Deflection Spectroscopy
- Effect of Sulphur on the Surface Segregation in Co50Ni50 Alloy
- Ionic Current Study in Thermally Grown Silicon Dioxide Films on Polycrystalline Silicon
- Investigation of the Surface States in Heavily Doped GaAs by Kelvin Probe
- Influence of Texture Formation on Properties of Films for Perpendicular Magnetic Recording
- Characterization of the Leakage-Current Diffusion Component in Intrinsically Gettered Silicon by EBIC
- Auger Electron and X-Ray Spectroscopic Analysis of Au-Ge Contacts to GaAs
- Localized electronic states
- Thermal Donors and Carbon-Oxygen Defects in Silicon
- Electronic transport; superconductivity
- Electrical Resistivity and Scattering Mechanisms of (GeTe)1-x ((Ag2Te)1-y (Sb2Te3)y)x Solid Solutions (y = 0.6)
- Electrical Characteristics of Melt Grown CuInTe2 Single Crystals
- Magnetic properties; resonances
- Magnetic Properties of Rapidly Quenched Fe75B25-xNdx (0 ≤ x ≤ 25) Alloys
- Photoinduced Change of Magnetic Resonance in FeBO3 Single Crystals
- Study of the Magnetic Transitions in CeFe2 with High Resolution Transport Property Measurements
- Dielectric and optical properties
- Dielectric Properties of the KCl-KBr Mixed Crystal System
- Dielectric and Ferroelectric Properties in AsxSb1-xSI Mixed Crystals
- Device-related phenomena
- Modelling the Influence of Hot Electrons on the Transfer Characteristic of Short-Channel MOSFETs
- Properties of Red Light-Emitting (AlGa)As Single-Heterostructure Diodes. I. Structure Characterization
- Short Notes
- On the Thermal Conductivity of CuInSe2xS2(1-x)
- Pressure Dependence of the Bulk Modulus in Solids
- Transformation Toughening Fatigue Crack Growth
- Surface Properties of Ion Alloyed Thin Dysprosium Films
- Dose Dependence of N(E-F) in Evaporated a-Si
- Attempts to Find a Correlation between the GaAs Plasma Oxide Growth Conditions and the Charge DLTS Response of Interface States
- On DLTS-Measurements of t h e Barrier-Limited Capture Process
- Thermally Stimulated Exoelectron Emission (TSEE) of Heat Treated K2SO4 and of Sm-Dy-Doped K2SO4
- Aspects of Magnetic Penetration in Vanadium Based Josephson Junctions
- Polynomial Expression of the Bloch-Gruneisen Integral — Application to an Analysis of the Resistivity-Temperature Variation of Metals
- EPR Investigations on Mn-Doped CVD-Grown ZnS Thin Film Layers
- Preparation and Magnetic Properties-of La1-xThxCoO3 Compounds
- The Dependence of the Hyperfine Magnetic Field in Amorphous Alloys of the Type Fe80-xTMxB20 on TM, x, and Temperature
- The Influence of Yttrium Substitution on the Ferromagnetic Transition of Uranium Selenide
- Thermoluminescence and Thermally Stimulated Exoelectron Emission of Sintered CaB4O7 Doped with Fb, Eu, or Dy
- On the Possibility of Application of the Derivative Lightoutput-Voltage Characteristic for the Analysis of Electron-Phonon Interaction in Electroluminescent ZnSe MPS Structures
- Effects of Carbon Profiles at the p/i Interface in Amorphous Silicon Solar Cells
- A Simple Model of the Drain Saturation Voltage Dependence with Gate Voltage for Short-Channel MOSFETs
- Pre-Printed Titles
- Pre-Printed Titles of papers to be published in the next issues of physica status solidi (a) and physica status solidi (b)
- Substance Classification
- Backmatter
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