Physica status solidi / A. / Volume 108, Number 1, : July 1988 / / ed. by Görlich.

• Superior document: Title is part of eBook package: De Gruyter DGBA Reference Works <1990
• MitwirkendeR: Abajs, S.,; Akramov, A. Sh.,; Aksenov, I. A.,; Ali, A. R.,; Aliev, A. E.,; Almukhametov, R. F.,; Amato, G.,; Arajs, S.,; Baiguzin, E. Ya.,; Bakhtizin, R. Z.,; Balasubramanian, C.,; Baltrūnas, D.,; Bao, Xi-Mao,; Bath, A.,; Battistig, G.,; Berezovets, V. A.,; Bindemann, R.,; Biró, L. P.,; Borodi, G.,; Braune, W.,; Burkel, E.,; Carabatos-Nedelec, C.,; Chen, Li-Rong,; Chung, C. H.,; Czurratis, P.,; Cândea, Rodica M.,; Darabont, Al.,; De, A.,; Demishev, G. B.,; Deus, P.,; Diniz, J. M. B. Fernandes,; Domínguez-Adame, F.,; Drüsedau, T.,; Dubst, K.-D.,; Dādărlat, N.,; Eckler, M.,; El-Hiti, M.,; Ervens, W.,; Euthymiou, P. C.,; Fahim, M. A.,; Feit, B.,; Feltz, A.,; Fershtat, L. N.,; Fitori, P.,; Fitting, H.-J.,; Fizzotti, F.,; Flagmeyer, R.,; Frey, H.,; Fried, M.,; Fries, S.,; Geiger, J.,; Goede, O.,; Goltsev, V. P.,; Gonzalo, J. A.,; Gottschalch, V.,; Gu, Qing,; Guylai, J.,; Gwiazda,,; Hada, M.,; Harbukn, G.,; Hartmann, U.,; Hashimoto, M.,; Hecht, D.,; Heimbrodt, W.,; Henniger, U.,; Hertel, P.,; Heyting, M.,; Idzikowski, B.,; Ikari, T.,; Imura, T.,; Iselbobn, S.,; Jacobi, G.,; Jaroli, E.,; Jeandel, G.,; Jenkins, T. A.,; Jeon, H. W.,; Jiles, D. C.,; Jitsukawa, S.,; Kabalkina, S. S.,; Kahnt, H.,; Kawashima, R.,; Khabibullaev, P. K.,; Khanh, N. Q.,; Khater, F.,; Kim, H. K.,; Kim, K. M.,; Kletowski, Z.,; Kobiyama, M.,; Kochelab, V. V.,; Koga, Y.,; Kolobyanina, T. N.,; Korngiebel, E.,; Kronmüller, H.,; Kubicki, N.,; Kuznetsov, V. I.,; Kużnicka, B.,; Köpp, Th.,; Laczik, Z.,; Lepley, B.,; Litvinov, V. V.,; Liu, Hongjian,; Lohner, T.,; Lugakov, P. F.,; Lukyanitsa, V. V.,; Löfflee, H.,; Löffler, H.,; Makovetskaya, L. A.,; Manfredotti, C.,; Manna, I.,; Mariańka, E.,; Matsuda, T.,; Melker, A. I.,; Melnikov, A. A.,; Mendez, B.,; Menzler, H. P.,; Mercurio, D.,; Metzger, H.,; Mikhailin, A. I.,; Moblot, G.,; Moeller, H.,; Molodkin, V. B.,; Motiejūnas, S.,; Mukhamadeeva, N. N.,; Nakagawa, Y.,; Nakamura, S.,; Nakamura, Y.,; Nakata, K.,; Narayandass, Sa. K.,; Neumann, H.,; Olekhnovich, A. I.,; Olikhovskii, S. I.,; Opanowicz, A.,; Osinovskii, M. E.,; Pabi, S. K.,; Pagnia, H.,; Palchik, G. V.,; Papaioannou, G. J.,; Park, H. L.,; Parry, B. H.,; Peisl, J.,; Piasecki, R.,; Piqueras, J.,; Prieto, C.,; Pyshnaya, N. B.,; Radautsan, S. I.,; Ramirez, R.,; Rao, K. V.,; Raoufi, A.,; Ravelet, S.,; Rubinina, N . M.,; Saka, H.,; Savchuk, V. A.,; Schiller, V.,; Schirrmeister, F.,; Schmidt, B.,; Schröder, B.,; Schumann, B.,; Sequeika, C. A. C.,; Serpi, A.,; Shigetomi, S.,; Shiktorov, N.,; Shipilo, V. B.,; Shishonok, E. M.,; Smirnov, A. O.,; Sotnik, N.,; Su, Wenhui,; Subbarayan, A.,; Sumiyama, K.,; Sun, Changyong,; Suzuki, K.,; Szablewski, J.,; Takamura, S.,; Takeuchi, N.,; Tbuong, Chu Thien,; Tempel, R.,; Thijsse, B. J.,; Tiginyanu, I. M.,; Tilley, R. J. D.,; Turcu, Rodica,; Urenev, V. I.,; Valeev, V. G.,; Van Den Beukel, A.,; Vengalis, B.,; Voland, U.,; Volk, T. R.,; Waclawek, W.,; Wallner, G.,; Wang, Fatang,; Warin, A.,; Weinert, H.,; Wendrock, G.,; Williams, R. P.,; Windsch, W.,; Wrzeciono, A.,; Yakshibaev, R. A.,; Yen, Tzu-Tung,; Zabrowska-Waclawek, M.,; Zaitsev, A. M.,; Zhang, Yupu,; Zhou, Jianshi,; Zhukova, S. I.,; Zielinger, J. P.,; Zych, W.,
• HerausgeberIn: Görlich,
• Place / Publishing House: Berlin ;, Boston : : De Gruyter, , [2022]; ©1988
• Year of Publication: 2022
• Edition: Reprint 2021
• Language: English
• Series: Physica status solidi / A. ; Volume 108, Number 1
• Physical Description: 1 online resource (580 p.)
• Other title: Frontmatter --; International Classification System for Physics --; Author Index --; Contents --; Review Article --; Bistable Switching in Electroformed Metal-Insulator-Metal Devices --; Original Papers --; Structure; crystallography --; The Thickness Dependence of the X-Ray Diffuse Scattering Intensity for Crystals with Microdefects at Laue-Case Diffraction --; Effect of the Structure of Laser Crystallized Silicon-on-lnsulator on Impurity Diffusion --; X-Ray Studies of Thallium Chalcogenides T1S and TISe up to 37 GPa --; Change of Electrical Resistance during Crystallization of Icosahedral Al86Mn14 --; On the Existence Field of Guinier-Preston Zones in the Al-Zn System --; Diffraction Patterns from Ordered Intergrowth Phases in the Bi208-Te02 System --; Internal Distortion in GaInAsP Quaternary Alloys Studied by Ion Channeling --; Grazing Incidence X-Ray Diffraction from Si with an Implantation Induced Amorphous Surface Layer --; Defects; nonelectronic transport --; Phase Transformations and Ionic Transport in the Cu2 — 3Te Superionic Conductor --; Influence of Irradiation Temperature on Radiation Defect Accumulation in Silicon --; Model of Photostimulated Diffusion of Ag in Amorphous Chalcogenides --; Transport Equations in Common Solid State Electrochemical Situations --; Effect of Alloying on the Void Swelling in Cu-Base and Ag-Base Alloys --; The Effect of Additions of Mn and Cr and the Applied Solidification Technique on the Structure of an AI-2.2 at% Zn-1.4 at% Mg Alloy --; Dielectric Constant and ITC Measurements of BaF2:Dy 3+ --; Lattice properties --; Mechanism of a Superion Phase Transition in a-LiIO3 --; Effect of a Deviation from Stoichiometry on the Mossbauer Parameters of Sn 0.8 Ge 0.2 Te during the Phase Transition --; Atomic Mechanisms of Fracture Nucleation and Fracture Development in Two-Dimensional Crystals in Thermodynamic Equilibrium --; Internal Friction in Single-Crystal Al Alloys after Electron Irradiation at Low Temperature --; Low-Temperature Thermal Expansion of ZnSiAs2 --; Surfaces, interfaces, thin films; lower-dimensional systems --; The Influence of the Film History on Some Electrophysical Properties of YE, CAD, and COD PbSe Films --; Strain Coefficients of Electrical Resistance of Double-Layer Thin Metallic Films --; Microroughness Field Emission Electron Energy Distribution and Electron-Phonon Interaction Spectroscopy Near the Metal Surface --; Multi-Quantum-Well Structures Prepared by the Flash Evaporation Technique --; Secondary Electron Tield Emission --; The Influence of Hydrogen Surface Reactions on the Growth of Evaporated a-Si:H Films --; Photoconductive a-Si:H with Dominant Monohydride Bonding Prepared by DC-Magnetron Sputtering --; Structure and Magnetic Properties of Nonequilibrium Te-Ru Alloys Produced by Vapor Quenching --; Investigation of Interface Peculiarities in Anodized p-InSb MOS Structures --; Localized electronic states --; Extrinsic Self-Trapping and Negative U of Oxygen-Related Thermal Donors in Germanium --; Electronic transport; superconductivity --; Injection and Recombination Currents in a-Si:H Structures --; An Explanation of Electrical Conductivity Data for Copper Phthalocyanine-Acetylene Carbon Black Mixtures --; Magnetic and Superconducting Properties of REBa2Cu3O 9-y (RE = Sm, Eu, Gd, Dy, Ho, Er, Tm)2) --; Electrical Resistivity of Some Directionally Solidified Nickel-Base Eutectic Composites --; On the Photoconductivity Relaxation in ZnIn2S4 --; Resistance of Some Lanthanum and Lutetium Compounds of the Type (La, Lu)Me 3 --; Stress Dependence of Magnetoresistance in Crystalline and Amorphous Ferromagnets --; Magnetic properties; resonances --; Properties of Amorphous SmxFe 80—x B20 Ribbons --; On the Influence of Copper Atoms on Domain Wall Energy and Pinning Force in Ni-Cu Alloys --; Observation of a New Domain Nucleation Process in Soft Magnetic Materials --; Investigations of the Magnetic Properties and Demagnetization Processes of an Extremely High Coercive Sm(Co, Cu, Fe, Zr)7.6 Permanent Magnet --; Variation of the Magnetic Properties of AISI 4140 Steels with Plastic Strain --; Dielectric and optical properties --; Influence of High Pressure on Cathodoluminescence of Cubic Boron Nitride --; X-Bay and UV Influence on the Optical Absorption Spectra of the Non-Photorefractive Lithium Niobate --; Photoacoustic Spectroscopy of CdTe and (Hg, Cd)Te --; Extraordinary versus Ordinary Refractive Index Change in Planar LiNb03:Ti Waveguides --; Dielectric Properties of CaF2 Single Crystals Irradiated with X-Rays under a High Electric Field or y-Rays --; Decrease of the TL Glow Peak Temperature by Partial Cleaning --; Device-related phenomena --; Temperature Distribution in Square-Shaped Semiconductor Chips --; Short Notes --; The Loss of Strength of Al Alloy alter Sb+ Implantation --; Activation Energy for Precipitation in Undeformed and Deformed Cu-Cr Alloys --; Brillouin Scattering Determination of the Elastic Constants of Tris-Sarcosine Calcium Chloride at Room Temperature --; On the Equation of Solid State at High Pressure --; A Resistometric Study of Migrating Boundary Characteristics in Pb-Sn Alloys --; Frenkel Effect in SIPOS Films --; Laser-Induced Damage Study of Vacuum Deposited Perylene Thin Films --; Ellipsometric and Ion Backscattering Measurements of the Properties of Silicon-On-Insulator Structure Formed by Thermally Activated Redistribution of High-Dose Ion Implanted Nitrogen --; Determination by Optical DLTS of the Distribution of States near the Valence Band of Plasma Oxidized n-Type InP --; Comments on the Interpretation of Thermally Stimulated Luminescence and Conductivity in Conductive ZnSe Crystals --; Electrical Properties of Cd-Doped p-InSe --; Electrical Properties of InP:Fe Single Crystals Implanted by Phosphorus Ions --; Electrical Properties of Cadmium and Zinc Doped CuAlS2 --; The Influence of Transition Metal Substitution and B 3/2 Values for Some Amorphous Alloys --; Temperature Dependence of the Dielectric Constant in Samarium Nitrate Crystals --; Determination of x in Hg 1-x ZnxTe Single Crystals by the Temperature Coefficient of the Energy Gap --; SEM-CL of Reaction Bonded SiC --; Pre-Printed Titles --; Substance Classification --; Manuscripts and letters for physica status solidi (b) — basic research and physica status solidi (a) — applied research
• Format: Mode of access: Internet via World Wide Web.
• ISBN: 9783112501306; 9783110637342
• DOI: 10.1515/9783112501306
• Access: restricted access
• Hierarchical level: Monograph
• Statement of Responsibility: ed. by Görlich.