Physica status solidi / A. / Volume 90, Number 2, : August 16 / / ed. by Görlich.
Αποθηκεύτηκε σε:
Other title: | Frontmatter -- Contents -- Original Pap -- Structure -- X-Ray Topography of Thin Subsurface Layers -- A Generalized Criterion for the Transition from the Layer to the Continuous Mechanism of Crystal Growth -- Application of X-Ray Photoelectron Energy Analysis to Depth-Selective Studies of the Subsurface-Layer Structure -- Influence of Permanent Electric Fields on the Successive Phase Transitions in the Solid Solutions of the System (Pb 1-x Bax) ZrO3 -- Mesomorphic Behaviour of Mixtures of Cetyl Alcohol and Dimethyl Sulfoxide -- Kinetics of Laser-Induced Liquid Metal Etching of a-Si Films -- Formation of MoSi2 by Light Pulse Irradiation -- Observation of Ni8Mo Ordered Phase in Ni-Mo Alloys -- Relation between the Pair Potentials VAA and VBB in Classical Statistical Physics of the Order-Disorder Transitions in Binary Substitutional Alloys -- Two-Step Ageing Treatments as a Means to Estimate the Zinc Content of Guinier-Preston Zones at Elevated Temperatures in an Al-15 at% Zn Alloy -- Investigation of the Structure of Molten Ge15Te85 in Dependence on Temperature -- Defects atomistic aspects -- On the Applicability of Conventional Contrast Theory to Weak Beam Images of Stacking Faults -- Phenomena of Structural Defect Recovery in Molybdenum -- The Spatial Distribution of Frenkel Pair Components Created in Germanium and Silicon under Irradiation -- Mobile Dislocation Density Variation during Strain Rate Change Evidenced by Acoustic Emission -- Study of an Experimental Technique for High-Temperature Deformation of Compound Semiconductors (Liquid Encapsulation) -- The Dependence of Li Phase Nucleation on the Structure of Partial Dislocations in Silicon -- Diffusion of Chromium in α-Iron -- Work-Hardening Rates during the Steady-State Creep of Aluminum and Alloys Determined from Stress-Change Tests -- Phase-Contrast Microscopy in Comparison with Other Light-Microscopic Methods for Direct Observation of Dislocation Lines in Single Crystals -- The Interaction between Slip and Twinning Systems in Natural Sphalerite Experimentally Deformed -- Positron Annihilation and Magnetic Susceptibility Measurements on Annealed Fast-Neutron Irradiated Crystalline Quartz -- Gold Solid Solution Decay in Silicon -- Strengthening of Alloys by Atomic Order -- Magnetism -- Magnetostriction of Ni-Zn and Co-Zn Ferrites -- The Coercive Field of the Partially Crystallized Amorphous Alloy Fe40Ni40P14B6 -- The Influence of Neutron Irradiation on the Magnetic Relaxation Spectrum of Commercial Non-Oriented Iron-Silicon Steel -- Magnetic Properties of Superconducting Oxygen-Doped Vanadium Foils -- Low-Temperature Mössbauer Measurement of a Polymeric Oxalate (2,2'-Bipyridine) Iron Compound -- Magnetic and Thermal Behaviour of the Amorphous Ferromagnet Fe79B16Si5 -- Extended electronic states and transitions -- Maximum Depth of Characteristic X-Ray Generation -- Simple Model for Thermoluminescence in Conductive Semiconductors -- ESR and Other Properties of Copper-Substituted Tellurium Vanadate Glasses -- On the Radiative Recombination in ZnIn2S4 -- Electric transport -- Effect of Pressure on Electrical Conductivity of TlInSe2 Single Crystals -- Electrical Properties of Polycrystalline Silicon in the Dark and under Illumination -- Bulk Conductivity, Polarization, and Thermally Stimulated Currents of Insulated Polar Crystals -- Electrical Conductivity of Polyester Polymer Containing Carbon Black -- Peculiarities in the Temperature Dependence of the Hall Coefficient in Tin Telluride -- On the Influence of Heating Rate in the Dipolar Relaxation of Ce2(SO4)3 9H2O Single Crystals -- AC and DC Superimposed AC Conduction in Sodium Fluoride Thin Films -- A Formulation for the Critical Temperature Tc of Ll2-Type Superconductors -- Device-related phenomena -- Influence oi Organic Molecules on the Current-Voltage Characteristic of Planar MIM Diodes -- The Use of Ion Implantation in the Fabrication of Cu2S-CdS Thin Film Solar Cells -- Short Notes -- On the Crystal Structure of Thin CdS Films Grown by Pulse Laser Evaporation -- precise Lattice Constant Determination of Hexagonal, Rhombohedral, and Tetragonal Crystals from X-Ray Powder Diffractometric Data -- Transitional Epitaxial Layers in Nickel Films Deposited in Vacuum on Complex LiF/NaCl Substrates -- An Ion Microprobe Mass Analysis of Indium Contacts on Mercury Cadmium Telluride -- Thermal Conductivity of LiKSO4 at Low Temperatures -- On the Filler Induced Modification of the Glass Transition Temperature and Hardness of an Epoxy Resin Composite Material -- Elastic Constants of the (RE)2Fe14B Tetragonal Compound (RE = Y, Nd, and Pr) -- On a Connection between Vacancy Formation Parameters and Melting Process in Rare Gas Solids -- Oxygen Donor Formation and Oxygen Precipitation in Czochralski Silicon Due to Heat Treatment at 600 to 800 °C -- The Observation on Atom Displacements of Silicon Highly Doped by Arsenic during Post-Annealing -- On the Mechanism of Domain Wall Break-Through from Localized Obstacles in Thin Magnetic Films -- Magnetic Properties of Fe80-xTMxB20 and Fe80-xMnxSi12B8 Amorphous Alloys -- Cd2-W - a New Material for Permanent Magnets? -- Preparation and Properties of Barium Substituted Gadolinium Cobaltite -- Peculiarities of Photomagnetization and Magnetoelectric Interactions in Ferrites -- Peculiarities of the First-Order Phase Transition in MnAs -- Magnetic Susceptibility and the Hall Effect in the FeCr2-xInxS4 (0≤x≤1) System -- Deduction of Semiconductor Parameters from the Frequency Dependence of Free Carrier Reflectivity -- Some Observations on the Absorption of Copper in Photochromic Glass -- Picosecond Spectroscopy and Photoconductivity of n-InP -- Microwave Conductivity of Dislocations in Deformed Silicon Single Crystals -- An Interfacial Property of the InGaAs/Semi-Insulating InP Structure Prepared by Metal Organic Vapor Phase Epitaxy -- Investigation of Illuminance-Voltage Characteristics for Thin-Film p-CdTe—n-CdTe—n-CdS Structures -- Influence of Electron Lithography on Electrical Parameters of MOS Structures -- Pre-Printed Titles |
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Μορφή: | Mode of access: Internet via World Wide Web. |
ISBN: | 9783112494806 9783110637342 |
DOI: | 10.1515/9783112494806 |
Πρόσβαση: | restricted access |
Hierarchical level: | Monograph |
Statement of Responsibility: | ed. by Görlich. |
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