Leakage current and defect characterization of short channel MOSFETs / / Guntrade Roll.

Saved in:
Bibliographic Details
VerfasserIn:
Place / Publishing House:Berlin : : Logos Verlag Berlin,, [2014]
2014
Year of Publication:2014
Language:English
Series:Research at NaMLab ; 2
Online Access:
Physical Description:1 online resource (242 pages).
Tags: Add Tag
No Tags, Be the first to tag this record!
Description
ISBN:9783832532611
9783832596668
Hierarchical level:Monograph
Statement of Responsibility: Guntrade Roll.