Conductive atomic force microscopy : : applications in nanomaterials / / edited by Mario Lanza.
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| TeilnehmendeR: | |
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| Place / Publishing House: | Weinheim, Germany : : Wiley-VCH,, 2017. 2017 |
| Year of Publication: | 2017 |
| Language: | English |
| Online Access: | |
| Physical Description: | 1 online resource (99 pages) |
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| Bibliography: | Includes bibliographical references at the end of each chapters and index. |
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| ISBN: | 9783527340910 9783527699797 |
| Hierarchical level: | Monograph |
| Statement of Responsibility: | edited by Mario Lanza. |