Electromigration in ULSI interconnections / Cher Ming Tan.

Saved in:
Bibliographic Details
Superior document:International series on advances in solid state electronics and technology (ASSET)
:
TeilnehmendeR:
Year of Publication:2010
Language:English
Series:International series on advances in solid state electronics and technology.
Online Access:
Physical Description:xix, 291 p. :; ill. (some col.), col. port.
Tags: Add Tag
No Tags, Be the first to tag this record!