Electromigration in ULSI interconnections / Cher Ming Tan.
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| Superior document: | International series on advances in solid state electronics and technology (ASSET) |
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| Year of Publication: | 2010 |
| Language: | English |
| Series: | International series on advances in solid state electronics and technology.
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| Online Access: | |
| Physical Description: | xix, 291 p. :; ill. (some col.), col. port. |
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| Bibliography: | Includes bibliographical references and index. |
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| ISBN: | 9814273325 9789814273329 9789814273336 (electronic bk.) |
| Hierarchical level: | Monograph |
| Statement of Responsibility: | Cher Ming Tan. |