Dr. Juraj Todt

Function: Post Doc
Room: 302
Phone: +43 (0) 3842-804-302
E-Mail: juraj.todt(at)oeaw.ac.at



  • A combinatorial X-ray sub-micron diffraction study of microstructure, residual stress and phase stability in TiAlN coatings
    A. Riedl, R. Daniel, J. Todt, M. Stefenelli, D. Holec, B. Sartory, C. Krywka, M. Müller, C. Mitterer, J. Keckes
    Surface & Coatings Technology, 108-113 (2014)
  • Superior oxidation resistance, mechanical properties and residual stresses of an Al-rich nanolamellar Ti<sub>0.05</sub>Al<sub>0.95</sub>N coating prepared by CVD
    J. Todt, R. Pitonak, A. Köpf, R. Weißenbacher, B. Sartory, M. Burghammer, R. Daniel, T. Schöberl, J. Keckes
    Surface & Coatings Technology, 1119-1127 (2014)
  • Mono-textured nanocrystalline thin films with pronounced stress-gradients: On the role of grain boundaries in the stress evolution
    R. Daniel, E. Jäger, J. Todt, B. Sartory, C. Mitterer, J. Keckes
    Journal of Applied Physics, 203507-1-9 (2014)
  • Macroscopic Fracture Behaviour of CrN Hard Coatings Evaluated by X-Ray Diffraction Coupled with Four-Point Bending
    M. Stefenelli, A. Riedl, J. Todt, M. Bartosik, R. Daniel, C. Mitterer, J. Keckes
    Materials Science Forum, 272-279 (2014)
  • Oxidation Behaviour of a Novel Nanolamellar Ti0.05Al0.95N Coating
    J. Todt
    , 35 (2013)
  • X-ray analysis of residual stress gradients in TiN coatings by a Laplace space approach and crosssectional nanodiffraction: a critical comparison
    M. Stefenelli, J. Todt, A. Riedl, W. Ecker, T. Müller, R. Daniel, M. Burghammer, J. Keckes
    Journal of Applied Crystallography46, 1-8 (2013)
  • X-ray nanodiffraction analysis of stress oscillations in a W thin film on through-silicon via
    J. Todt, H. Hammer, B. Satory, M. Burghammer, J. Kraft, R. Daniel, J. Keckes, S. Defregger
  • In-situ Observation of Cross-Sectional Microstructural Changes and Stress Distributions in Fracturing TiN Thin Film during Nanoindentation
    A. Zeilinger, J. Todt, C. Krywka, M. Müller, W. Ecker, B. Satory, M. Meindlhumer, M. Stefanelli, R. Daniel, C. Mitterer, J. Keckes
    Scientific Reports6, 1-14)