Univ.-Prof. Dr. Jozef Keckes

Function: Vice Chair Material Physics / Group Leader
Room: 303
Phone: +43 (0) 3842-804-303
E-Mail: jozef.keckes(at)unileoben.ac.at


Micro- and Nanostructure Characterization and Micro- and Nanomechanics


In-situ X-ray scattering on micro- and nano-scaled materials, structure and mechanical properties of thin films, structure-property relationship in biological materials, application of synchrotron radiation, XRD, SAXS, WAXS, GISAXS


Materialkundliche Arbeitsverfahren/Metallkundliche Arbeitsverfahren, Seminar aus Werkstoffphysik I and II, Übungen zu Materialkundliche Arbeitsverfahren




  • Radial crystalline texture in a lyocell fibre revealed by synchrotron nanofocus wide-angle X-ray scattering
    W. Gindl-Altmutter, S.J. Eichhorn, M. Burghammer, J. Keckes
    Cellulose, 1-7 (2013)
  • Origins of microstructure and stress gradients in nanocrystalline thin films: The role of growth parameters and self-organization
    R. Daniel, J. Keckes, I. Matko, M. Burghammer, C. Mitterer
    Acta Materialia, 6255-6266 (2013)
  • Cross-sectional X-ray nanobeam diffraction analysis of a compositionally graded CrNx thin film
    M. Bartosik, R. Daniel, C. Mitterer, I. Matko, M. Burghammer, P.H. Mayrhofer, J. Keckes
    Thin Solid Films, 1-4 (2013)
  • Self-organized periodic soft-hard nanolamellae in polycrystalline TiAlN thin films
    J. Keckes, R. Daniel, C. Mitterer, I. Matko, B. Sartory, A. Koepf, R. Weißenbacher, R. Pitonak
    Thin Solid Films545, 29-32 (2013)
  • X-ray analysis of residual stress gradients in TiN coatings by a Laplace space approach and crosssectional nanodiffraction: a critical comparison
    M. Stefenelli, J. Todt, A. Riedl, W. Ecker, T. Müller, R. Daniel, M. Burghammer, J. Keckes
    Journal of Applied Crystallography46, 1-8 (2013)
  • Effects of structure and interfaces on fracture toughness of CrN/AlN multilayer coatings
    K.C. Schlögl Manfred
    Scripta Materialia, 917-920 (2013)
  • Influence of AlN layers on mechanical properties and thermal stability of Cr-based nitride coatings
    P.J. Schlögl Manfred
    Thin Solid Films, 113-118 (2013)
  • Nanodiffraction at MINAXS (P03) beamline of PETRA III
    K.J. Krywka C.
    Journal of Physics, 072021-4 (2013)
  • Nanodiffraction at MINAXS (P03) beamline of PETRA III
    K.J. Krywka C.
    , 072021-4 (2013)
  • TiO2(100)/Al2O3(0001) interface: A first-principles study supported by experiment
    S.J. Popov Maxim N.
    Physical Review B, 205309-1-13 (2012)