
Univ.-Prof. Dr. Jozef Keckes
Function: Vice Chair Material Physics / Group Leader
Room: 303
Phone: +43 (0) 3842-804-303
E-Mail: jozef.keckes(at)unileoben.ac.at
Research
Micro- and Nanostructure Characterization and Micro- and Nanomechanics
Methods
In-situ X-ray scattering on micro- and nano-scaled materials, structure and mechanical properties of thin films, structure-property relationship in biological materials, application of synchrotron radiation, XRD, SAXS, WAXS, GISAXS
Teaching
Materialkundliche Arbeitsverfahren/Metallkundliche Arbeitsverfahren, Seminar aus Werkstoffphysik I and II, Übungen zu Materialkundliche Arbeitsverfahren
Projects
Publications
- New insights into single-grain mechanical behavior from temperature-dependent 3-D coherent X-ray diffraction
Acta Materialia, 46-55 (2014) - Mono-textured nanocrystalline thin films with pronounced stress-gradients: On the role of grain boundaries in the stress evolution
Journal of Applied Physics, 203507-1-9 (2014) - Macroscopic Fracture Behaviour of CrN Hard Coatings Evaluated by X-Ray Diffraction Coupled with Four-Point Bending
Materials Science Forum, 272-279 (2014) - Depth-resolved residual stress analysis with high-energy synchrotron X-rays using a conical slit cell
Materials Science Forum, 72-75 (2014) - Supersaturation in Ag–Ni alloy by two-step high-pressure torsion processing
Philosophical Magazine Letters, 9-17 (2014) - Radial crystalline texture in a lyocell fibre revealed by synchrotron nanofocus wide-angle X-ray scattering
Cellulose, 1-7 (2013) - Origins of microstructure and stress gradients in nanocrystalline thin films: The role of growth parameters and self-organization
Acta Materialia, 6255-6266 (2013) - Cross-sectional X-ray nanobeam diffraction analysis of a compositionally graded CrNx thin film
Thin Solid Films, 1-4 (2013) - Self-organized periodic soft-hard nanolamellae in polycrystalline TiAlN thin films
Thin Solid Films545, 29-32 (2013) - X-ray analysis of residual stress gradients in TiN coatings by a Laplace space approach and crosssectional nanodiffraction: a critical comparison
Journal of Applied Crystallography46, 1-8 (2013)