Univ.-Prof. Dr. Jozef Keckes

Function: Vice Chair Material Physics / Group Leader
Room: 303
Phone: +43 (0) 3842-804-303
E-Mail: jozef.keckes(at)unileoben.ac.at


Micro- and Nanostructure Characterization and Micro- and Nanomechanics


In-situ X-ray scattering on micro- and nano-scaled materials, structure and mechanical properties of thin films, structure-property relationship in biological materials, application of synchrotron radiation, XRD, SAXS, WAXS, GISAXS


Materialkundliche Arbeitsverfahren/Metallkundliche Arbeitsverfahren, Seminar aus Werkstoffphysik I and II, Übungen zu Materialkundliche Arbeitsverfahren




  • New insights into single-grain mechanical behavior from temperature-dependent 3-D coherent X-ray diffraction
    N. Vaxelaire, S. Labat, T.W. Cornelius, C. Kirchlechner, J. Keckes, T. Schulli, O. Thomas
    Acta Materialia, 46-55 (2014)
  • Mono-textured nanocrystalline thin films with pronounced stress-gradients: On the role of grain boundaries in the stress evolution
    R. Daniel, E. Jäger, J. Todt, B. Sartory, C. Mitterer, J. Keckes
    Journal of Applied Physics, 203507-1-9 (2014)
  • Macroscopic Fracture Behaviour of CrN Hard Coatings Evaluated by X-Ray Diffraction Coupled with Four-Point Bending
    M. Stefenelli, A. Riedl, J. Todt, M. Bartosik, R. Daniel, C. Mitterer, J. Keckes
    Materials Science Forum, 272-279 (2014)
  • Depth-resolved residual stress analysis with high-energy synchrotron X-rays using a conical slit cell
    P. Staron, T. Fischer, J. Keckes, S. Schratter, T. Hatzenbichler, N. Schell, M. Müller, A. Schreyer
    Materials Science Forum, 72-75 (2014)
  • Supersaturation in Ag–Ni alloy by two-step high-pressure torsion processing
    A. Bachmaier, J. Keckes, K. Kormout, R. Pippan
    Philosophical Magazine Letters, 9-17 (2014)
  • Radial crystalline texture in a lyocell fibre revealed by synchrotron nanofocus wide-angle X-ray scattering
    W. Gindl-Altmutter, S.J. Eichhorn, M. Burghammer, J. Keckes
    Cellulose, 1-7 (2013)
  • Origins of microstructure and stress gradients in nanocrystalline thin films: The role of growth parameters and self-organization
    R. Daniel, J. Keckes, I. Matko, M. Burghammer, C. Mitterer
    Acta Materialia, 6255-6266 (2013)
  • Cross-sectional X-ray nanobeam diffraction analysis of a compositionally graded CrNx thin film
    M. Bartosik, R. Daniel, C. Mitterer, I. Matko, M. Burghammer, P.H. Mayrhofer, J. Keckes
    Thin Solid Films, 1-4 (2013)
  • Self-organized periodic soft-hard nanolamellae in polycrystalline TiAlN thin films
    J. Keckes, R. Daniel, C. Mitterer, I. Matko, B. Sartory, A. Koepf, R. Weißenbacher, R. Pitonak
    Thin Solid Films545, 29-32 (2013)
  • X-ray analysis of residual stress gradients in TiN coatings by a Laplace space approach and crosssectional nanodiffraction: a critical comparison
    M. Stefenelli, J. Todt, A. Riedl, W. Ecker, T. Müller, R. Daniel, M. Burghammer, J. Keckes
    Journal of Applied Crystallography46, 1-8 (2013)