
Univ.-Prof. Dr. Jozef Keckes
Function: Vice Chair Material Physics / Group Leader
Room: 303
Phone: +43 (0) 3842-804-303
E-Mail: jozef.keckes(at)unileoben.ac.at
Research
Micro- and Nanostructure Characterization and Micro- and Nanomechanics
Methods
In-situ X-ray scattering on micro- and nano-scaled materials, structure and mechanical properties of thin films, structure-property relationship in biological materials, application of synchrotron radiation, XRD, SAXS, WAXS, GISAXS
Teaching
Materialkundliche Arbeitsverfahren/Metallkundliche Arbeitsverfahren, Seminar aus Werkstoffphysik I and II, Übungen zu Materialkundliche Arbeitsverfahren
Projects
Publications
- Nanoscale residual stress depth profiling by Focused Ion Beam milling and eigenstrain analysis
Materials and Design, 55-64 (2018) - Cross-sectional characterization techniques as the basis for knowledge-based design of graded CVD TiN-TiB2 coatings
International Journal of Refractory Metals and Hard Materials, 280-284 (2018) - Phase evolution and carbon redistribution during continuous tempering of martensite studied with high resolution techniques
Mater. Des.136, 214-222 (2017) - 30 nm X-ray focusing correlates oscillatory stress, texture and structural defect gradients across multilayered TiN-SiOx thin film
Acta Materialia, 862-873 (2017) - Structural modifications in sub-T-g annealed CuZr-based metallic glass
Mater. Sci. Eng. A-Struct. Mater. Prop. Microstruct. Process.707, 245-252 (2017) - Resolving alternating stress gradients and dislocation densities across Al x Ga 1-x N multilayer structures on Si(111)
Applied Physics Letters111, ARTN 162103 (2017) - Finite element modeling of the residual stress evolution in forged and direct-aged alloy 718 turbine disks during manufacturing and its experimental validation
, ARTN 070001 (2017) - Atomic origin for rejuvenation of a Zr-based metallic glass at cryogenic temperature
J. Alloy. Compd.718, 254-259 (2017) - High resolution residual stress gradient characterization in W/TiN-stack on Si(100): Correlating in-plane stress and grain size distributions in W sublayer
Mater. Des.132, 72-78 (2017) - Single-shot full strain tensor determination with microbeam X-ray Laue diffraction and a two- dimensional energy-dispersive detector
Journal of Applied Crystallography50, 901-908 (2017)