Univ.-Prof. Dr. Jozef Keckes

Function: Vice Chair Material Physics / Group Leader
Room: 303
Phone: +43 (0) 3842-804-303
E-Mail: jozef.keckes(at)unileoben.ac.at

Research

Micro- and Nanostructure Characterization and Micro- and Nanomechanics

Methods

In-situ X-ray scattering on micro- and nano-scaled materials, structure and mechanical properties of thin films, structure-property relationship in biological materials, application of synchrotron radiation, XRD, SAXS, WAXS, GISAXS

Teaching

Materialkundliche Arbeitsverfahren/Metallkundliche Arbeitsverfahren, Seminar aus Werkstoffphysik I and II, Übungen zu Materialkundliche Arbeitsverfahren

Projects

 

Publications

  • Eigenspannungs-Charakterisierungen
    E.E. Keckes Jozef
    Graz, DI Stefan Pichler, www.artig.at(2010,2649-2656)
  • HT-XRD - Spannungen und Deformationen
    E.E. Resch Christian
    Graz, DI Stefan Pichler, www.artig.at(2010,2649-2656)
  • Oberflächencharakterisierung mit der GI-SAXS Methode
    K.J. Maier Günther
    Graz, DI Stefan Pichler, www.artig.at(2010,2649-2656)
  • Methodology for studying strain inhomogeneities in polycrystalline thin films during in situ thermal loading using coherent x-ray diffraction
    P.H. Vaxelaire N.
    New Journal of Physics, 1-12 (2010)
  • X-ray diffraction analysis of three-dimensional residual stress fields reveals origins of thermal fatigue in uncoated and coated steel
    M.K. Kirchlechner Christoph
    Scripta Materialia, 774-777 (2010)
  • The origin of stresses in magnetron-sputtered thin films with zone T structures
    M.K. Daniel R.
    Acta Materialia, 2621-2633 (2010)
  • Zellulose-Nanokompositwerkstoffe
    D.G. Keckes Jozef
    BIONIK Innovation & Qualifikation, 66-69 (2010)
  • X-ray nanodiffraction analysis of stress oscillations in a W thin film on through-silicon via
    J. Todt, H. Hammer, B. Satory, M. Burghammer, J. Kraft, R. Daniel, J. Keckes, S. Defregger
    JOURNAL OF APPLIED CRYSTALLOGRAPHY49, 182-187)
  • In-situ Observation of Cross-Sectional Microstructural Changes and Stress Distributions in Fracturing TiN Thin Film during Nanoindentation
    A. Zeilinger, J. Todt, C. Krywka, M. Müller, W. Ecker, B. Satory, M. Meindlhumer, M. Stefanelli, R. Daniel, C. Mitterer, J. Keckes
    Scientific Reports6, 1-14)