Univ.-Prof. Dr. Jozef Keckes
Function: Vice Chair Material Physics / Group Leader
Room: 303
Phone: +43 (0) 3842-804-303
E-Mail: jozef.keckes(at)unileoben.ac.at
Research
Micro- and Nanostructure Characterization and Micro- and Nanomechanics
Methods
In-situ X-ray scattering on micro- and nano-scaled materials, structure and mechanical properties of thin films, structure-property relationship in biological materials, application of synchrotron radiation, XRD, SAXS, WAXS, GISAXS
Teaching
Materialkundliche Arbeitsverfahren/Metallkundliche Arbeitsverfahren, Seminar aus Werkstoffphysik I and II, Übungen zu Materialkundliche Arbeitsverfahren
Projects
Publications
- Eigenspannungs-Charakterisierungen
Graz, DI Stefan Pichler, www.artig.at(2010,2649-2656) - HT-XRD - Spannungen und Deformationen
Graz, DI Stefan Pichler, www.artig.at(2010,2649-2656) - Oberflächencharakterisierung mit der GI-SAXS Methode
Graz, DI Stefan Pichler, www.artig.at(2010,2649-2656) - Methodology for studying strain inhomogeneities in polycrystalline thin films during in situ thermal loading using coherent x-ray diffraction
New Journal of Physics, 1-12 (2010) - X-ray diffraction analysis of three-dimensional residual stress fields reveals origins of thermal fatigue in uncoated and coated steel
Scripta Materialia, 774-777 (2010) - The origin of stresses in magnetron-sputtered thin films with zone T structures
Acta Materialia, 2621-2633 (2010) - Zellulose-Nanokompositwerkstoffe
BIONIK Innovation & Qualifikation, 66-69 (2010) - X-ray nanodiffraction analysis of stress oscillations in a W thin film on through-silicon via
JOURNAL OF APPLIED CRYSTALLOGRAPHY49, 182-187) - In-situ Observation of Cross-Sectional Microstructural Changes and Stress Distributions in Fracturing TiN Thin Film during Nanoindentation
Scientific Reports6, 1-14)