Univ.-Prof. Dr. Jozef Keckes

Function: Vice Chair Material Physics / Group Leader
Room: 303
Phone: +43 (0) 3842-804-303
E-Mail: jozef.keckes(at)unileoben.ac.at


Micro- and Nanostructure Characterization and Micro- and Nanomechanics


In-situ X-ray scattering on micro- and nano-scaled materials, structure and mechanical properties of thin films, structure-property relationship in biological materials, application of synchrotron radiation, XRD, SAXS, WAXS, GISAXS


Materialkundliche Arbeitsverfahren/Metallkundliche Arbeitsverfahren, Seminar aus Werkstoffphysik I and II, Übungen zu Materialkundliche Arbeitsverfahren




  • Cellulose nanofibrils as filler for adhesives: effect on specific fracture energy of solid wood-adhesive bonds
    M.U. Veigel Stefan
    Cellulose, 1227-1237 (2011)
  • Impact of instrumental constraints and imperfections on the dislocation structure in micron-sized Cu compression pillars
    K.J. Kirchlechner Christoph
    Acta Materialia, 5618-5626 (2011)
  • Dislocation storage in single slip-oriented Cu micro-tensile samples: New insights via X-ray microdiffraction
    K.D. Kirchlechner Christoph
    Philosophical Magazine, 1256-1264 (2011)
  • Interface study of a high-performance W/B4C X-ray mirror
    J.M. Siffalovic Peter
    Journal of Applied Crystallography, 1431-1439 (2010)
  • Thermally-induced formation of hexagonal AlN in AlCrN hard coatings on sapphire: Orientation relationships and residual stresses
    D.R. Bartosik Matthias
    Surface & Coatings Technology, 1320-1323 (2010)
  • Eigenspannungs-Charakterisierungen
    E.E. Keckes Jozef
    Graz, DI Stefan Pichler, www.artig.at(2010,2649-2656)
  • HT-XRD - Spannungen und Deformationen
    E.E. Resch Christian
    Graz, DI Stefan Pichler, www.artig.at(2010,2649-2656)
  • Oberflächencharakterisierung mit der GI-SAXS Methode
    K.J. Maier Günther
    Graz, DI Stefan Pichler, www.artig.at(2010,2649-2656)
  • Methodology for studying strain inhomogeneities in polycrystalline thin films during in situ thermal loading using coherent x-ray diffraction
    P.H. Vaxelaire N.
    New Journal of Physics, 1-12 (2010)
  • X-ray diffraction analysis of three-dimensional residual stress fields reveals origins of thermal fatigue in uncoated and coated steel
    M.K. Kirchlechner Christoph
    Scripta Materialia, 774-777 (2010)