Univ.-Prof. Dr. Jozef Keckes

Function: Vice Chair Material Physics / Group Leader
Room: 303
Phone: +43 (0) 3842-804-303
E-Mail: jozef.keckes(at)unileoben.ac.at


Micro- and Nanostructure Characterization and Micro- and Nanomechanics


In-situ X-ray scattering on micro- and nano-scaled materials, structure and mechanical properties of thin films, structure-property relationship in biological materials, application of synchrotron radiation, XRD, SAXS, WAXS, GISAXS


Materialkundliche Arbeitsverfahren/Metallkundliche Arbeitsverfahren, Seminar aus Werkstoffphysik I and II, Übungen zu Materialkundliche Arbeitsverfahren




  • Quantum mechanically guided design of Co43Fe20Ta5.5X31.5 (X = B, Si, P, S) metallic glasses
    M.D. Hostert C.
    Journal of Physics Condensed Mater, 175402(9pp) (2012)
  • Lateral gradients of phases, residual stress and hardness in a laser heated Ti0.52Al0.48N coating on hard metal
    D.R. Bartosik Matthias
    Surface & Coatings Technology, 4502-4510 (2012)
  • The structure and mechanical properties of spines from the cactus opuntia ficus-indica
    K.J. Gindl-Altmutter Wolfgang
    BioResources, 1232-1237 (2012)
  • A two-dimensional waveguide beam for X-ray nanodiffraction
    N.H. Krywka Christina
    Journal of Applied Crystallography, 85-92 (2012)
  • Expected and unexpected plastic behavior at the micron scale: An in situ µLaue tensile study
    C. Kirchlechner, P.J. Imrich, W. Grosinger, M.W. Kapp, J. Keckes, J.S. Micha, O. Ulrich, O. Thomas, S. Labat, C. Motz, G. Dehm
    Acta Materialia, 1252-1258 (2012)
  • Ab initio molecular dynamics model for density, elastic properties and short range order of Co–Fe–Ta–B metallic glass thin films
    M.D. Hostert C.
    Journal of Physics: Condensed Matter, 475401-475408 (2011)
  • In Situ High Temperature X-Ray Diffraction Reveals Residual Stress Depth-Profiles in Blasted TiN Hard Coatings
    P.R. Bartosik Matthias
    Advanced Engineering Materials, 705-711 (2011)
  • Size effect of thermal expansion and thermal/intrinsic stresses in nanostructured thin films: Experiment and model
    H.D. Daniel R.
    Acta Materialia, 6631-6645 (2011)
  • In Situ µLaue: Instrumental Setup for the Deformation of Micron Sized Samples
    K.J. Kirchlechner Christoph
    Advanced Engineering Materials, 837-844 (2011)
  • Decomposition pathways in age hardening of Ti-Al-N films
    M.S. Rachbauer R.
    Journal of Applied Physics, 023515-1-023515-10 (2011)