Priv.-Doz. Dr. Zaoli Zhang

Function: Group Leader
Room: 311
Phone: +43 (0) 3842-804-311
E-Mail: zaoli.zhang(at)


Micro- and Nanostructure Characterization


Atomic and electronic structural analysis of defects, thin films and heterostructure interfaces, conventional TEM, Cs-corrected HRTEM, STEM, image calculation, EELS and EDXS


Durchstrahlungselektronenmikroskopie von Festförpern and Advanced transmission electron microscopy for materials research



  • Atomic and electronic structures of a transition layer at the CrN/Cr interface
    D.R. Zhang Zaoli
    Journal of Applied Physics, 043524-1-4 (2011)
  • Dynamic behavior of nanometer-scale amporphous intergranular film in silicon nitride by in situ high-resolution transmission electron microscopy
    S.W. Zhang Zaoli
    Journal of the European Ceramic Society, 1835-1840 (2011)
  • In-situ TEM heating study of the γ lamellae formation inside the α2 matrix of a Ti-45Al-7.5Nb alloy
    C.H. Cha Limei
    Advanced Materials Research, 1365-1368 (2011)
  • Deformation mechanisms of a modified 316L austenitic steel subjected to high pressure torsion
    Z.Z. Scheriau Stephan
    Materials Science and Engineering A, 2776-2786 (2011)
  • Electrical properties and structure of grain boundaries in n-conducting BaTiO3 ceramics
    Z.Z. Hou Junbo
    Journal of the European Ceramic Society, 763-771 (2011)
  • Structural characterization of a Cu/MgO(001) interface using CS-corrected HRTEM
    Z.Z. Cazottes Sophie
    Thin Solid Films, 1662-1667 (2010)
  • Unveiling the atomic and electronic structure of the VN/MgO interface
    Z. Zhang, B. Rashkova, G. Dehm, P. Lazar, J. Redinger, R. Podlouky
    Physical Review B, 060103-1-4 (2010)
  • Large-Scale Synthesis of SnO2 Nanosheets with High Lithium Storage Capacity
    Z.Y. Wang Cen
    Journal of American Chemical Society JACS, 46-47 (2010)