Priv.-Doz. Dr. Zaoli Zhang

Function: Group Leader
Room: 311
Phone: +43 (0) 3842-804-311
E-Mail: zaoli.zhang(at)


Micro- and Nanostructure Characterization


Atomic and electronic structural analysis of defects, thin films and heterostructure interfaces, conventional TEM, Cs-corrected HRTEM, STEM, image calculation, EELS and EDXS


Durchstrahlungselektronenmikroskopie von Festförpern and Advanced transmission electron microscopy for materials research



  • Current oscillations in the layer-by-layer electrochemical deposition of vertically aligned nanosheets of zinc hydroxide nitrate
    W. Sun, K. Wu, M.A. Thomas, F. Meng, X. Song, Z. Sun, Z. Zhang, J. Cui
    Journal of the Electrochemical Society, D558-D564 (2013)
  • Transmission electron microscopy charaterization of CrN films on MgO(001)
    T.P. Harzer, R. Daniel, C. Mitterer, G. Dehm, Z. Zhang
    Thin Solid Films, 154-160 (2013)
  • Insights into the atomic and electronic structure triggered by ordered nitrogen vacancies in CrN
    L.H. Zhang Zaoli
    Physical Review B, 014104-1-9 (2013)
  • In Situ Study of &gamma;-TiAl Lamellae Formation in Supersaturated &alpha;<sub>2</sub>-Ti<sub>3</sub>Al Grains
    S.T. Cha Limei
    Advanced Engineering Materials, 299-303 (2012)
  • Influence of interrupted quenching on artificial aging of Al-Mg-Si alloys
    A.H. Pogatscher S.
    Acta Materialia, 4496-4505 (2012)
  • Advanced nanomechanics in the TEM: effects of thermal annealing on FIB prepared Cu samples
    Z.Z. Kiener Daniel
    Philosophical Magazine, 3269-3289 (2012)
  • Local symmetry breaking of a thin crystal structure of β-Si<sub>3</sub>N<sub>4</sub> as revealed by spherical aberration corrected high-resolution transmission electron microscopy images
    Z.Z. Kim Hwang Su
    Journal of Electron Microscopy, 145-157 (2012)
  • Bis ins kleinste Atom
    Z.Z. Kiener Daniel
    Thema "Das Forschungsmagazin der ÖAW", 40-41 (2012)
  • Comparative studies of the CrN/Cr/Si and CrN/Si interfaces by Cs-corrected HRTEM and STEM-EELS
    D.R. Zhang Zaoli
    MCM2011, 29-30 (2011)
  • Plasticity of FIB fabricated micro-samples investigated by in-situ micro-Laue diffraction and in-situ TEM
    K.C. Kiener Daniel
    MCM2011, 129-130 (2011)