Dr. Juraj Todt

Function: Post Doc
Room: 302
Phone: +43 (0) 3842-804-302
E-Mail: juraj.todt(at)unileoben.ac.at



  • Extraordinary high-temperature behavior of electrically conductive Hf7B23Si22C6N40 ceramic film
    P. Zeman, S. Zuzjakova, R. Cerstvy, J. Houska, Y. Shen, J. Todt, J. Jiang, R. Daniel, J. Keckes, E. Meletis, J. Vlcek
    Surf. Coat. Technol.391, ARTN 125686 (2020)
  • Indentation response of a superlattice thin film revealed by in-situ scanning X-ray nanodiffraction
    J. Todt, C. Krywka, Z. Zhang, P. Mayrhofer, J. Keckes, M. Bartosik
    Acta Materialia195, 425-432 (2020)
  • Nanoscale residual stress and microstructure gradients across the cutting edge area of a TiN coating on WC-Co
    M. Meindlhumer, N. Jäger, S. Spor, M. Rosenthal, J.F. Keckes, H. Hruby, C. Mitterer, R. Daniel, J. Keckes, J. Todt
    Scripta Materialia182, 11-15 (2020)
  • Inconel-steel multilayers by liquid dispersed metal powder bed fusion: Microstructure, Residual stress and Property Gradients
    S.C. Bodner, L. van der Vorst, J. Zalesak, J. Todt, J.F. Keckes, V. Maier-Kiener, B. Sartory, N. Schell, J. Hooijmans, J. Saurwalt, J. Keckes
    32, ARTN 101027 (2019)
  • Microstructure and stress gradients in TiW thin films characterized by 40 nm X-ray diffraction and transmission electron microscopy
    F. Saghaeian, J. Keckes, S. Woehlert, M. Rosenthal, M. Reisinger, J. Todt
    Thin Solid Films691, ARTN 137576 (2019)
  • Investigation of high cyclic fatigue behaviour of thin copper films using MEMS structure
    F. Saghaeian, M. Lederer, A. Hofer, J. Todt, J. Keckes, G. Khatibi
    Int. J. Fatigue128, ARTN 105179 (2019)
    S.C. Bodner, T. Ziegelwanger, M. Meindlhumer, J. Holcova, J. Todt, N. Schell, J. Keckes
    Metall. Ital., 6-10 (2019)
  • Au–Sn solders applied in transient liquid phase bonding: Microstructure and mechanical behavior
    C. Du, R. Soler, B. Völker, K. Matoy, J. Zechner, G. Langer, M. Reisinger, J. Todt, C. Kirchlechner, G. Dehm
    Materialia8, ARTN 100503 (2019)
  • Investigation of high cyclic fatigue behaviour of thin copper films using MEMS structure
    F. Saghaeian, M. Lederer, A. Hofer, J. Todt, J. Keckes, G. Khatibi
    Int. Journal of Fatique128, ARTN 105179 (2019)
  • Gradients of microstructure, stresses and mechanical properties in a multi-layered diamond thin film revealed by correlative cross-sectional nano-analytics
    D.P. Gruber, J. Todt, N. Woehrl, J. Zalesak, M. Tkadletz, A. Kubec, S. Niese, M. Burghammer, M. Rosenthal, H. Sternschulte, M.J. Pfeifenberger, B. Sartory, J. Keckes
    Carbon144, 666-674 (2019)
  • Biomimetic hard and tough nanoceramic Ti-Al-N film with self-assembled six-level hierarchy
    M. Meindlhumer, J. Zalesak, R. Pitonak, J. Todt, B. Sartory, M. Burghummer, A. Stark, N. Schell, D. Rostislav, J.F. Keckes, M. Lessiak, A. Köpf, R. Weißenbacher, J. Keckes
    Nanoscale2019,11, 7986-7995 (2019)
  • Anisotropy of fracture toughness in nanostructured ceramics controlled by grain boundary design
    D. Rostislav, M. Meindlhumer, W. Baumegger, J. Todt, J. Zalesak, T. Ziegelwanger, C. Mitterer, J. Keckes
    Materials and Design, 80-85 (2019)
  • Influence of Annealing on Microstructure and Mechanical Properties of a Nanocrystalline CrCoNi Medium-Entropy Alloy
    B. Schuh, B. Voelker, J. Todt, K. Kormout, N. Schell, A. Hohenwarter
    Materials11, ARTN 662 (2018)
  • Gradient residual strain and stress distributions in a high pressure torsion deformed iron disk revealed by high energy X-ray diffraction
    J. Todt, J. Keckes, G. Winter, P. Staron, A. Hohenwarter
    Scr. Mater., 178-181 (2018)
  • An investigation on shear banding and crystallographic texture of Ag–Cu alloys deformed by high-pressure torsion
    P. Ghosh, K. Kormout, J. Todt, U. Lienert, J. Keckes, R. Pippan
    Journal of mechanical science, 1-13 (2018)
  • Thermodynamic instability of a nanocrystalline, single-phase TiZrNbHfTa alloy and its impact on the mechanical properties
    B. Schuh, B. Voelker, J. Todt, N. Schell, L. Perriere, J. Li, J.P. Couzinie, A. Hohenwarter
    Acta Mater.142, 201-212 (2018)
  • Annealing effects on the film stress and adhesion of tungsten-titanium barrier layers
    A. Kleinbichler, J. Todt, J. Zechner, S. Wöhlert, D.M. Többens, M.J. Cordill
    Surface and Coatings Technology332, 376-381 (2017)
  • 30 nm X-ray focusing correlates oscillatory stress, texture and structural defect gradients across multilayered TiN-SiOx thin film
    J. Keckes, R. Daniel, J. Todt, J. Zalesak, B. Sartory, S. Braun, J. Gluch, M. Rosenthal, M. Burghammer, C. Mitterer, S. Niese, A. Kubec
    Acta Materialia, 862-873 (2017)
  • High resolution residual stress gradient characterization in W/TiN-stack on Si(100): Correlating in-plane stress and grain size distributions in W sublayer
    R. Hammer, J. Todt, J. Keckes, B. Sartory, G. Parteder, J. Kraft, S. Defregger
    Mater. Des.132, 72-78 (2017)
  • Phase Decomposition of a Single-Phase AlTiVNb High-Entropy Alloy after Severe Plastic Deformation and Annealing
    B. Schuh, B. Voelker, V. Maier-Kiener, J. Todt, J. Li, A. Hohenwarter
    Adv. Eng. Mater.19, UNSP 1600674 (2017)