Univ.-Prof. Dr. Jozef Keckes

Function: Vice Chair Material Physics / Group Leader
Room: 303
Phone: +43 (0) 3842-804-303
E-Mail: jozef.keckes(at)unileoben.ac.at


Micro- and Nanostructure Characterization and Micro- and Nanomechanics


In-situ X-ray scattering on micro- and nano-scaled materials, structure and mechanical properties of thin films, structure-property relationship in biological materials, application of synchrotron radiation, XRD, SAXS, WAXS, GISAXS


Materialkundliche Arbeitsverfahren/Metallkundliche Arbeitsverfahren, Seminar aus Werkstoffphysik I and II, Übungen zu Materialkundliche Arbeitsverfahren




  • Integrated experimental and computational approach for residual stress investigation near through-silicon vias
    M. Deluca, R. Hammer, J. Keckes, J. Kraft, F. Schrank, J. Todt, O. Robach, J.S. Micha, S. Defregger
  • Fracture toughness enhancement of brittle nanostructured materials by spatial heterogeneity: A micromechanical proof for CrN/Cr and TiN/SiOx multilayers
    R. Daniel, M. Meindlhumer, J. Zalesak, B. Sartory, A. Zeilinger, C. Mitterer, J. Keckes
    MATERIALS & DESIGN104, 227-234 (2016)
  • Cross-sectional stress distribution in AlxGa1-xN heterostructure on Si(111) substrate characterized by ion beam layer removal method and precession electron diffraction
    M. Reisinger, J. Zalesak, R. Daniel, M. Tomberger, J.K. Weiss, A.D. Darbal, M. Petrenec, J. Zechner, I. Daumiller, W. W. Ecker, B. Sartory, J. Keckes
    106, 476-481)
  • Al-rich cubic Al0.8Ti0.2N coating with self-organized nano-lamellar microstructure: Thermal and mechanical properties
    J. Todt, J. Zalesak, R. Daniel, R. Pitonak, A. Koepf, R. Weissenbacher, B. Sartory, C. Mitterer, J. Keckes
    Surf. Coat. Technol.271, 89-93 (2016)
  • Cross-sectional structure-property relationship in a graded nanocrystalline Ti1−xAlxN thin film
    J. Zalesak, M. Bartosik, R. Daniel, C. Mitterer, C. Krywka, D. Kiener, P.H. Mayrhofer, J. Keckes
    Acta Materialia102, 212-219 (2016)
  • Mechanical property enhancement in laminates through control of morphology and crystal orientation
    A. Zeilinger, R. Daniel, M. Stefenelli, B. Sartory, L. Chitu, M. Burghammer, T. Schoeberl, O. Kolednik, J. Keckes, C. Mitterer
    J. Phys. D-Appl. Phys.48, ARTN 295303 (2015)
  • Microstructure-controlled depth gradients of mechanical properties in thin nanocrystalline films: Towards structure-property gradient functionalization
    R. Daniel, A. Zeilinger, T. Schoeberl, B. Sartory, C. Mitterer, J. Keckes
    J. Appl. Phys.117, ARTN 235301 (2015)
  • Resolving depth evolution of microstructure and hardness in sputtered CrN film
    A. Zeilinger, R. Daniel, T. Schoeberl, M. Stefenelli, B. Sartory, J. Keckes, C. Mitterer
    Thin Solid Films581, 75-79 (2015)
  • X-ray nanodiffraction reveals stress distribution across an indented multilayered CrN-Cr thin film
    M. Stefanelli, R. Daniel, W. Ecker, D. Kiener, J. Todt, A. Zeilinger, C. Mitterer, M. Burghammer, J. Keckes
    Acta Materialia, 24-31 (2015)
  • Copper diffusion into single-crystalline TiN studied by transmission electron microscopy and atom probe tomography
    M. Muehlbacher, F. Mendez-Martin, B. Sartory, N. Schalk, J. Keckes, J. Lu, L. Hultman, C. Mitterer
    Thin Solid Films574, 103-109 (2015)