Univ.-Prof. Dr. Jozef Keckes

Function: Vice Chair Material Physics / Group Leader
Room: 303
Phone: +43 (0) 3842-804-303
E-Mail: jozef.keckes(at)unileoben.ac.at


Micro- and Nanostructure Characterization and Micro- and Nanomechanics


In-situ X-ray scattering on micro- and nano-scaled materials, structure and mechanical properties of thin films, structure-property relationship in biological materials, application of synchrotron radiation, XRD, SAXS, WAXS, GISAXS


Materialkundliche Arbeitsverfahren/Metallkundliche Arbeitsverfahren, Seminar aus Werkstoffphysik I and II, Übungen zu Materialkundliche Arbeitsverfahren




  • Atomic origin for rejuvenation of a Zr-based metallic glass at cryogenic temperature
    X.L. Bian, G. Wang, J. Yi, Y.D. Jia, J. Bednarcik, Q.J. Zhai, I. Kaban, B. Sarac, M. Muehlbacher, F. Spieckermann, J. Keckes, J. Eckert
    J. Alloy. Compd.718, 254-259 (2017)
  • High resolution residual stress gradient characterization in W/TiN-stack on Si(100): Correlating in-plane stress and grain size distributions in W sublayer
    R. Hammer, J. Todt, J. Keckes, B. Sartory, G. Parteder, J. Kraft, S. Defregger
    Mater. Des.132, 72-78 (2017)
  • Single-shot full strain tensor determination with microbeam X-ray Laue diffraction and a two- dimensional energy-dispersive detector
    A. Abboud, C. Kirchlechner, J. Keckes, T. Conka Nurdan, S. Send, J.S. Micha, O. Ulrich, R. Hartmann, L. Strüderf, U. Pietsch
    Journal of Applied Crystallography50, 901-908 (2017)
  • Complementary High Spatial Resolution Methods in Materials Science and Engineering
    O. Paris, D. Lang, J. Li, P. Schumacher, M. Deluca, R. Daniel, M. Tkadletz, N. Schalk, C. Mitterer, J. Todt, J. Keckes, Z. Zhang, G. Fritz-Popovski, C. Ganser, C. Teichert, H. Clemens
    Adv. Eng. Mater.19, UNSP 1600671 (2017)
  • Peculiarity of self-assembled cubic nanolamellae in the TiN/AlN system: Epitaxial self-stabilization by element deficiency/excess
    J. Zalezak, D. Holec, I. Matko, Petrenec M., B. Sartory, N. Koutna, R. Daniel, R. Pitonak, J. Keckes
    Acta Materialia131, 391-399 (2017)
  • Effect of growth conditions on interface stability and thermophysical properties of sputtered Cu films on Si with and without WTi barrier layers
    I. Souli, V.L. Terziyska, J. Keckes, W. Robl, J. Zechner, C. Mitterer
    Journal of Vacuum Science and Technology B: Nanotechnology and Microelectronics35, ARTN 022201 (2017)
  • In Situ μLaue: Instrumental Setup for the Deformation of Micron Sized Samples
    C. Kirchlechner, J. Keckes, J.S. Micha, G. Dehm
    In: Neutrons and Synchrotron Radiation in Engineering Materials Science: From Fundamentals to Applications:, Wiley (, 425-438)
  • Nanostructured coatings for tooling applications
    A. Köpf, J. Keckes, J. Todt, R. Pitonak, R. Weissenbacher
    International Journal of Refractory Metals and Hard Materials62, 219-224 (2017)
  • Grain boundary design of thin films: Using tilted brittle interfaces for multiple crack deflection toughening
    R. Daniel, M. Meindlhumer, W. Baumegger, J. Zalesak, B. Sartory, M. Burghammer, C. Mitterer, J. Keckes
    Acta Mater.122, 130-137 (2017)
  • Combinatorial refinement of thin-film microstructure, properties and process conditions: iterative nanoscale search for self-assembled TiAlN nanolamellae
    J. Zalesak, J. Todt, R. Pitonak, A. Köpf, R. Weißenbacher, B. Sartory, M. Burghammer, R. Daniel, J. Keckes