A JEOL JEM-2100F is field emission gun transmission electron microscope equipped with an imaging spherical aberration corrector (CEOS), Oxford INCA Energy TEM 200 EDS system, high-angle annular dark field detector, Gatan annular dark field detector/bright field detector, as well as Gatan (Tridiem) image filter (GIF) system. With the aberration corrector, the ultrahigh resolution atom imaging of crystal lattice can be readily achieved.
Specifications
- Acceleration Voltage: 80kV, 200kV
- Information limit: 1.4 Å or better, 1.9Å (80kV)
- Energy resolution: 0.92eV@110µA
- STEM resolution: 1.6 Å
- 2.7 Å (80kV)
- A probe size: < 2.0 Å
Cameras
- Gatan Orius SC 1000 (2k × 4k)
- GIF UltraScan (2k ×2k)
Specimen stages
- Single tilt holder
- Double tilt low background holder
- In-situ heating/cooling/straining holder
- Hysitron PI-95 TEM PicoIndenter