The scanning electron microscope MAGNA from Tescan is a powerful tool for imaging in ultrahigh resolution. With each immersion optics and crossover-free electron beam it allows excellent imaging, also at low electron energies. With its manifold detectors

  • Everhart-Thornley secondary electron detector
  • In column secondary electron detector
  • 4 quadrant backscatter detector
  • Low-energy backscatter detector
  • Scanning transmission detector, subdivided into four ring segments

it allows investigation of all kind of materials, investigated at the institute. The beam deceleration option and a “low vacuum modus” (chamber pressure up to 500 Pa) widen the imaging possibilities of this microscope.

  • Electron backscatter diffraction detector (Bruker)
  • Electron dispersive X-ray detector (Bruker)

are also attached to the SEM, complementing qualitative microstructural investigation capabilities with quantitative access onto chemistry and microstructure.

Fracture Surface of W sample, after a fatigue crack growth experiment

Back scatter detector micrograph of the microstructure of Ta, severe plastically deformed using high-pressure torsion

Dark-field STEM image of Ti, severe plastically deformed using HPT